journal article·1994-10

Detection of C?H bonds in crystalline ?-SiC by IR-absorption measurements

K. Rottner, R. Helbig

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Abstract

No abstract is available for this record. The assistant can identify its topic from the title, but cannot infer the study’s results.

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Research context

OpenAlex topics: Thin-Film Transistor Technologies · Semiconductor materials and devices · Silicon Nanostructures and Photoluminescence

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References (13)

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10. K. Rottner, R. Helbig: MRS Symp. Proc. 339 (in press)
11. Ch. Haberstroh, R. Helbig, S. Leibenzeder: In Amorphous and Crystalline Silicon Carbide IV, ed. by C.Y. Yang, M.M. Rahman, G.L. Harris, Springer Proc. Phys., Vol. 71 (Springer, Berlin, Heidelberg 1992) p. 22110.1007/978-3-642-84804-9_33 ↗
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