journal article·1989-12

Sputtering yields of nickel and chromium

G. P. Chen, J. Seggern, H. Gnaser, W. O. Hofer

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Abstract

No abstract is available for this record. The assistant can identify its topic from the title, but cannot infer the study’s results.

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Research context

OpenAlex topics: Ion-surface interactions and analysis · Metal and Thin Film Mechanics · Fusion materials and technologies

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References (24)

Show source-provided references
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2. H. Oechsner (ed.):Thin Film and Depth Profile Analyis. Vol. 37 Topics Curr. Phys. (Springer, Berlin, Heidelberg 1984)
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