journal article·1989-12

In situ spectroscopic ellipsometry: Application to Sb coverage measurement in the monolayer range on Si (111)

S. Andrieu, F. Ferrieu, F. Arnaud d'Avitaya

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OpenAlex topics: Surface and Thin Film Phenomena · Surface Roughness and Optical Measurements · Electron and X-Ray Spectroscopy Techniques

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References (23)

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