In-depth concentration profiling of garnet epilayers using secondary ion mass spectrometry
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Abstract
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Research context
OpenAlex topics: Ion-surface interactions and analysis · Diamond and Carbon-based Materials Research · Electronic and Structural Properties of Oxides
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References (5)
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3. J.M.Rouberol, J.Guernet, P.Deschamps, J.P.Dagnot, J.M.Guyon de la Berge: Proc. 5th Int. Conf. X-Ray Optics and Microanalysis, Tübingen 1968 (Springer-Verlag, Berlin, Heidelberg, New York 1969) p. 311
4. W.Tolksdorf, G.Bartels, G.P.Espinosa, P.Holst, D.Mateika, F.Welz: J. Crystal Growth17, 322 (1972)10.1016/0022-0248(72)90264-3 ↗
5. A.E.Morgan: J. Crystal Growth27, 266 (1974)10.1016/S0022-0248(74)80073-4 ↗