Influence of substrate in photothermal measurements of thin film absorption
Bibliographic record
Abstract
No abstract is available for this record. The assistant can identify its topic from the title, but cannot infer the study’s results.
Source: Not provided · Quality: missing
Research context
OpenAlex topics: Thermography and Photoacoustic Techniques · Transition Metal Oxide Nanomaterials · Calibration and Measurement Techniques
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (5)
Show source-provided references
1. N.M. Amer, W.B. Jackson: In Semiconductors and Semimetals, ed. by J.I. Pankove, vol. 21, part B (Academic, London 1984)
2. B. Mongeau, G. Rousset, L. Bertrand: Can. J. Phys. 64, 1056 (1986)10.1139/p86-180 ↗
3. P. Helander, I. Lundstrom: J. Appl. Phys. 54, 5069 (1983)10.1063/1.332780 ↗
4. A. Mandelis, Y.C. Teng, B.S.H. Royce: J. Appl. Phys. 50, 7138 (1979)10.1063/1.325823 ↗
5. J.M. Viner, C. Lee, W.D. Holsen, P.C. Taylor: In Amorphous Silicon Technology, ed. by A. Madan, P.C. Taylor, P.G. LeComber, M.J. Thompson, J.A. Hamakawa, MRS Symp. Proc., vol. 149 (MRS, Pittsburgh 1989)