Analytical approximate equations for the resistivity and its temperature coefficient in thin polycrystalline metallic films

journal article·1977-10

C. R. Tellier, A. J. Tosser

Applied Physics· Volume 14· Issue 2

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Abstract

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OpenAlex topics: Copper Interconnects and Reliability · Metal and Thin Film Mechanics · Semiconductor materials and devices

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15. C.R.Tellier, R.C.Boutrit, A.J.Tosser: Internal note, University of Nancy (1977)