journal article·1984-01

Tellurium-related trap levels in silicon

K. Hofmann, M. Schulz

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Abstract

No abstract is available for this record. The assistant can identify its topic from the title, but cannot infer the study’s results.

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Research context

OpenAlex topics: Silicon and Solar Cell Technologies · Advanced Semiconductor Detectors and Materials · Semiconductor materials and interfaces

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References (16)

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