journal article·1990-12

Direct ion beam deposition of polymeric styrene films and in situ characterization by electron spectroscopy

D. Ugolini, M. -H. Tuilier, J. Eitle, S. Schelz, J. Q. Wang, P. Oelhafen

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OpenAlex topics: Ion-surface interactions and analysis · Electron and X-Ray Spectroscopy Techniques

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References (19)

Show source-provided references
1. H. Yasuda: Plasma Polymerization (Academic, New York 1985)
2. S. Aisenberg, R.W. Chabot: J. Appl. Phys. 42, 2953 (1971)10.1063/1.1660654 ↗
3. C. Weissmantel, K. Bewilogua, C. Sch�rer, K. Breuer, Z. Zscheile: Thin Solid Films 61, L 1 (1979)10.1016/0040-6090(79)90451-6 ↗
4. M.J. Mirtich: In Amorphous Hydrogenated Carbon Films, ed. by P. Koidl, P. Oelhafen (Les Editions de Physique, Les Ulis 1987) p. 377
5. P. Oelhafen, D. Ugolini: ?Photoelectron spectroscopy measurements on in situ prepared a-C: H films?. In Amorphous Hydrogenated Carbon Films, ed. by P. Koidl, P. Oelhafen (Les Editions de Physique, Les Ulis 1987) p. 267
6. C. Weissmantel: In Amorphous Hydrogenated Carbon Films ed. by P. Koidl, P. Oelhafen (Les Editions de Physique, Les Ulis 1987) p. 49
7. H.R. Kaufman: J. Vac. Sci. and Technol. 15, 272 (1978)10.1116/1.569569 ↗
8. D. Ugolini, P. Oelhafen, M. Wittmer: ?Characterization of a-C:H/substrate interfaces by electron spectroscopy measurements I: Semiconducting substrates?. In Amorphous Hydrogenated Carbon Films ed. by P. Koidl, P. Oelhafen (Les Editions de Physique, Les Ulis 1987) p. 287
9. D. Ugolini, J. Eitle, P. Oelhafen, M. Wittmer: Appl. Phys. A 48, 549 (1989)10.1007/BF00617856 ↗
10. J.W. Rabalais, R.J. Colton: J. Electron. Spectrosc. Rel. Phen. 1, 83 (1972/1973)10.1016/0368-2048(72)85006-0 ↗
11. J.J. Yeh, I. Lindau: At. Data Nucl. Data Tables 32, 1 (1985)10.1016/0092-640X(85)90016-6 ↗
12. D.T. Clark, D.B. Adams, A. Dilks, J. Peeling, H.R. Thomas: J. Electron Spectrosc. Rel. Phen. 8, 51 (1976)10.1016/0368-2048(76)80006-0 ↗
13. A. Richter, H.J. Scheile, W. Pompe, K.W. Brzezinka, I. M�hlung: J. Non-Cryst. Solids 88, 131 (1986)10.1016/S0022-3093(86)80093-X ↗
14. L.J. Bellamy: Infrared Spectra of Complex Molecules, 3rd edition (Wiley, New York 1975)10.1007/978-94-011-6017-9 ↗
15. B. Dischler: ?Bonding and Hydrogen Incorporation in a-C:H Studied by Infrared Spectroscopy. In Amorphous Hydrogenated Carbon Films, ed. by P. Koidl, P. Oelhafen (Les Editions de Physique, Les Ulis 1987) p. 189
16. C.B. Duke, W.R. Salaneck, T.J. Fabish, J.J. Ritsko, H.R. Thomas, A. Paton: Phys. Rev. B 18, 5717 (1978)10.1103/PhysRevB.18.5717 ↗
17. D. Ugolini, J. Eitle, P. Oelhafen: ?Influence of process gas and deposition energy on the atomic electronic structure of diamond-like (a-C:H) films?. Submitted to Vacuum10.1016/0042-207X(90)93961-H ↗
18. P. Oelhafen, J.L. Freeouf, J.M.E. Harper, J.J. Cuomo: Thin Solid Films 120, 231 (1984)10.1016/0040-6090(84)90299-2 ↗
19. C. Wild, P. Koidl, J. Wagner: In Amorphous Hydrogenated Carbon Films, ed. by P. Koild, P. Oelhafen (Les Editions de Physique, Les Ulis 1987) p. 137