journal article·1994-02

Ellipsometric studies of porous silicon

L. H. Qin, Y. D. Zheng, R. Zhang, S. L. Gu, H. T. Shi, D. Feng

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Abstract

No abstract is available for this record. The assistant can identify its topic from the title, but cannot infer the study’s results.

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Research context

OpenAlex topics: Silicon Nanostructures and Photoluminescence · Semiconductor materials and devices · Nanowire Synthesis and Applications

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References (6)

Show source-provided references
1. L.T. Canham: Appl. Phys. Lett. 57, 1046 (1990)10.1063/1.103561 ↗
2. R.L. Smith, S.D. Collins: J. Appl. Phys. 71(8), R1 (1992)10.1063/1.350839 ↗
3. R.M.A. Azzam, N.M. Bashara: Ellipsometry and Polarized Light, (North-Holland, Amsterdam 1977)
4. L.H. Qin, Y.D. Zheng, R. Zhang: Appl. Phys. A 55, 297 (1992)10.1007/BF00348400 ↗
5. L.H. Qin, Y.D. Zheng, R. Zhang, D. Feng: Superlatt. Microstruct. 12(4), 517 (1992)10.1016/0749-6036(92)90312-S ↗
6. D.E. Aspnes: Thin Solid Films 89, 249 (1982)10.1016/0040-6090(82)90590-9 ↗