journal article·1991-07

Measurement of the interfacial energy between amorphous Si and crystalline Si

K. N. Tu

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Abstract

No abstract is available for this record. The assistant can identify its topic from the title, but cannot infer the study’s results.

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Research context

OpenAlex topics: Thin-Film Transistor Technologies · Silicon and Solar Cell Technologies · Silicon Nanostructures and Photoluminescence

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References (7)

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2. M. Avrami: J. Chem. Phys. 7, 1103 (1937); 8, 212 (1940); 9, 177 (1941)10.1063/1.1750380 ↗
3. J.W. Christian: The Theory of Transformation of Metals and Alloy (Pergamon, New York 1965)
4. D. Turnbull: Phase changes, Solid State Physics 3, 226 (1956)
5. L. Csepregi, J.W. Mayer, T.W. Sigmon: Appl. Phys. Lett. 29, 92 (1976)10.1063/1.88980 ↗
6. G.L. Olson, J.R. Roth: Kinetics of solid phase crystallization in amorphous silicon, Materials Science Reports, Vol. 3, No. 1 (North Holland, Amsterdam 1988)
7. E.P. Donovan, F. Spaepen, D. Turnbull, J.M. Poate, D.C. Jacobson: Appl. Phys. Lett. 42, 698 (1983)10.1063/1.94077 ↗