journal article·1988-06

LEED investigations on pure and metal treated vicinal silicon(111)

F. Jentzsch, M. Henzler

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Abstract

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Research context

OpenAlex topics: Surface and Thin Film Phenomena · Electron and X-Ray Spectroscopy Techniques · Advanced Materials Characterization Techniques

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References (15)

Show source-provided references
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5. F. Jentzsch, Th. Benz, M. Henzler: To be published
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