journal article·1980-08

Oxidation inhibiting properties of Si3N4-layers produced by ion implantation

M. Ramin, H. Ryssel, H. Kranz

Applied Physics· Volume 22· Issue 4
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Abstract

No abstract is available for this record. The assistant can identify its topic from the title, but cannot infer the study’s results.

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Research context

OpenAlex topics: Semiconductor materials and devices · Silicon and Solar Cell Technologies · Thin-Film Transistor Technologies

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References (13)

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