journal article·1979-09

Isochromat spectroscopy using SXAPS equipment

M. Conrad, V. Dose, Th. Fauster, H. Scheidt

Applied Physics· Volume 20· Issue 1
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Abstract

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Research context

OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Surface and Thin Film Phenomena · Advanced Materials Characterization Techniques

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References (17)

Show source-provided references
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