journal article·1976-10

On the abundance of molecular ions in secondary ion mass spectrometry

A. E. Morgan, H. W. Werner

Applied Physics· Volume 11· Issue 2
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Abstract

No abstract is available for this record. The assistant can identify its topic from the title, but cannot infer the study’s results.

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Research context

OpenAlex topics: Ion-surface interactions and analysis · Mass Spectrometry Techniques and Applications · Analytical chemistry methods development

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References (11)

Show source-provided references
1. For instance, see R. Behrisch, W. Heiland, W. Poschenrieder, P. Staib, H. Verbeek (eds.):Ion Surface Interaction, Sputtering and Related Phenomena (Gordon and Breach, London, New York, Paris 1973)
2. A.Benninghoven: Surface Sci.53, 596 (1975)10.1016/0039-6028(75)90158-2 ↗
3. M.Prager: Appl. Phys.8, 361 (1975)10.1007/BF00898371 ↗
4. J. M. Rouberol, J. Guernet, P. Deschamps, J. P. Dagnot, J. M. Guyon de la Berge: In5th Int. Conf. X-Ray Optics and Microanalysis, Tübingen 1968 (Springer-Verlag, Berlin, Heidelberg, New York 1969) p. 311
5. H.Liebl: J. Vac. Sci. Technol.12, 385 (1975)10.1116/1.568798 ↗
6. A.E.Morgan, H.W.Werner: Anal. Chem.48, 699 (1976)10.1021/ac60368a020 ↗
7. E. Stumpe, A. Benninghoven: Phys. Stat. Sol. (a)21, 479 (1974)10.1002/pssa.2210210212 ↗
8. H. W. Werner, H. A. M. de Frefte, J. van den Berg: Adv. Mass Spectrometry6, 673 (1974)
9. W.Gerhard: Z. Physik B22, 31 (1975)10.1007/BF01325457 ↗
10. D.E.Harrison, C.b.Delaplain: J. Appl. Phys.47, 2252 (1976)10.1063/1.323014 ↗
11. R.Buhl, A. Preisinger: Surface Sci.47, 344 (1975)10.1016/0039-6028(75)90299-X ↗