journal article·1975-12

Effect of residual oxygen on the formation of molecular ions in secondary ion mass spectrometry

M. Prager

Applied Physics· Volume 8· Issue 4
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Abstract

No abstract is available for this record. The assistant can identify its topic from the title, but cannot infer the study’s results.

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Research context

OpenAlex topics: Ion-surface interactions and analysis · Analytical chemistry methods development · Mass Spectrometry Techniques and Applications

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References (2)

Show source-provided references
1. V. Leroy, J. P. Servais, L. Habraken: C. Rech. Métall.35, 69 (1973)
2. J. M. Rouberol, J. Guernet, P. Deschamps, J. P. Dagnot, J. M. Guyon de la Berge: V. Int. Conf. X-Ray Optics and Microanalysis, Tübingen 1968 (Springer-Verlag, Berlin, Heidelberg, New York 1969), p. 311