journal article·1977-05

A device for measuring contact potential differences with high spatial resolution

R. Butz, H. Wagner

Applied Physics· Volume 13· Issue 1
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Abstract

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Research context

OpenAlex topics: Force Microscopy Techniques and Applications · Surface and Thin Film Phenomena · Electronic and Structural Properties of Oxides

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References (14)

Show source-provided references
1. R. Butz: Jül-1314, KFA Jülich (1976)
2. R. Butz, H. Wagner: Surface Sci. (in press)
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6. H.J. Fett: Jül-1332, KFA Jülich (1976)
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13. W.J. Smirnov:Lehrgang der höheren Mathematik, PtZ (VEB Deutscher Verlag der Wissenschaften, Berlin 1960) p. 536
14. J. Crank:Mathematics of Diffusion (Clarendon Press, Oxford 1967) p. 232