journal article·1974-07

Electrical and backscattering measurements of arsenic implanted silicon

H. Müller, H. Kranz, H. Ryssel, K. Schmid

Applied Physics· Volume 4· Issue 2
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Abstract

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Research context

OpenAlex topics: Silicon and Solar Cell Technologies · Integrated Circuits and Semiconductor Failure Analysis · Ion-surface interactions and analysis

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References (25)

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