journal article·1979-06

An RBS technique for measurement of the erosion rate of ion implanted films

G. Kiriakidis, C. E. Christodoulides, G. Carter, J. S. Colligon

Applied Physics· Volume 19· Issue 2
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Abstract

No abstract is available for this record. The assistant can identify its topic from the title, but cannot infer the study’s results.

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Research context

OpenAlex topics: Ion-surface interactions and analysis · Integrated Circuits and Semiconductor Failure Analysis · Advanced Surface Polishing Techniques

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References (12)

Show source-provided references
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10. N.Laegreid, G.K.Wehner: J. Appl. Phys.32, 361 (1961)10.1063/1.1736012 ↗
11. C.Fert, N.Colombie, B.Fagot, Phan Van Chuong: Colloq. Internat. CNRS, Bellevue, Paris 1962, No. 113, CNRS publication, Paris (1962)
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