Investigations of ZnSe-ZnO structures, by using the electrooptical and Auger depth profile methods
Bibliographic record
Abstract
No abstract is available for this record. The assistant can identify its topic from the title, but cannot infer the study’s results.
Source: Not provided · Quality: missing
Research context
OpenAlex topics: Semiconductor materials and interfaces · Integrated Circuits and Semiconductor Failure Analysis · Ion-surface interactions and analysis
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (12)
Show source-provided references
1. M.E. Ozsan, J. Woods: Solid State Electr.18, 519 (1975)10.1016/0038-1101(75)90028-3 ↗
2. C. Lawther, J. Woods: Phys. Stat. Solidi (a)44, 693 (1977)10.1002/pssa.2210440236 ↗
3. C. Lawther: Jpn. J. Appl. Phys.18, 849 (1979)10.1143/JJAP.18.849 ↗
4. W. Bała, F. Firszt, H. Łożykowski: J. Luminescence28, 204 (1983)
5. S. Satoh, K. Igaki: Jpn. J. Appl. Phys.19, 1953 (1980)10.1143/JJAP.19.1953 ↗
6. F. Koshiga, T. Sugano: Thin Solid Films56, 39 (1979)10.1016/0040-6090(79)90050-6 ↗
7. W. Bała, F. Firszt, Z. Nowak: Proc. on Conf. in Physics, Jaszowiec (1983)6, 308 (1983)
8. P.W. Palmberg: Anal. Chem.45, 549 (1973)
9. G.K. Wehner: InMethods of Surface Analysis (Elsevier, Amsterdam 1975), p. 510.1016/B978-0-444-41344-4.50008-2 ↗
10. C. van Opdorp: Philos. Res. Repts. Suppl. No. 10 (1969)
11. H. Męczyńska, W. Bała: Acta Physica Polonica64, 167 (1983)
12. W. Bała: Acta Physica Polonica (in press)