journal article·2014-07

Surface nanostructure effects on optical properties of Pb(Zr x Ti1−x )O3 thin films

Jarkko Puustinen, Jyrki Lappalainen, Jussi Hiltunen, Marianne Hiltunen

Applied Physics A· Volume 116· Issue 1
Publisher page

Abstract

Optical scattering properties of nanostructured matter have crucial impact on performance efficiency of various photonic components, such as waveguides, display elements, and solar cells. In this paper, diffuse transmission properties of nanocrystalline Pb(ZrxTi1-x)O3 thin films with a high refractive index of ~2.5 and optical transmittance are presented. Thin films with a thicknesses ranging from 50 to 500 nm were studied using integrating sphere technique and results were compared to simulations performed by a scalar scattering theory. Thin films were deposited by pulsed laser deposition at room temperature on MgO(100) substrates and post-annealed at a temperature of 800°C. Structural phase evolution-induced surface effects, which introduced periodicity on the film surface, cause the definite diffuse elements in transmission spectra of the films. Low and evenly distributed scattering amplitudes in k-space were seen for highly tetragonal- or trigonal-oriented films with non-textured surfaces, which led to low diffuse transmission values (TD≈ 5%), while confined and increased scattering amplitudes in k-space were seen for tetragonal-trigonal-oriented films, with phase co-existence, which led to microstructure-induced textured surfaces and increased diffuse transmission values (TD ≈ 50%). For highly textured surfaces, scattering amplitudes distributed in tilted ellipsoid shape in k-space was observed. Difference between modeled and measured values was 3.8 % in maximum
Source: openaire · Quality: candidate unverified · Source record ↗

Research context

OpenAlex topics: Ferroelectric and Piezoelectric Materials · Microwave Dielectric Ceramics Synthesis · Photorefractive and Nonlinear Optics

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

References (40)

Show source-provided references
1. R. Waser, Nanoelectronics and Information Technology: Advanced Electronic Materials and Novel Devices, 3rd edn. (Wiley-VCH, New York, 2012)
2. N. Setter, D. Damjanovic, L. Eng, G. Fox, S. Gevorgian, S. Hong, A. Kingon, H. Kohlstedt, N.Y. Park, G.B. Stephenson, I. Stolitchnov, A.K. Taganstev, D.V. Taylor, T. Yamada, S. Steiffer, J. Appl. Phys. 105, 051606 (2006)10.1063/1.2336999 ↗
3. M. Dawber, K.M. Rabe, J.F. Scott, Rev. Mod. Phys. 77, 1083–1130 (2005)10.1103/RevModPhys.77.1083 ↗
4. J. Kim Bok, P. Kim, N.C. Pegard, S. Ju Oh, C.R. Kagan, J.W. Fleischer, H.A. Stone, Y.H. Loo, Nat. Photonics 6, 327–332 (2012)10.1038/nphoton.2012.70 ↗
5. O. Isabella, F. Moll, J. Krc, M. Zeman, Phys. Status Solidi A 207(3), 642–646 (2010)10.1002/pssa.200982828 ↗
6. K. Bittkau, T. Beckers, Phys. Status Solidi A 207(3), 661–666 (2010)10.1002/pssa.200982671 ↗
7. Y.H. Ko, J.S. Yu, Opt. Express 19(16), 15574–15583 (2011)10.1364/OE.19.015574 ↗
8. Y.H. Ko, J.S. Yu, Opt. Express 19(27), 25935–25943 (2011)10.1364/OE.19.025935 ↗
9. W. Choi, M. Kim, SPIE Newsroom (2013). doi: 10.1117/2.1201303.00476510.1117/2.1201303.004765 ↗
10. M.F. Spencer, M.W. Hyde IV, SPIE Newsroom (2013). doi: 10.1117/2.1201306.00492210.1117/2.1201306.004922 ↗
11. D.K. Fork, F. Armani-Leplingard, J.J. Kingston, Mater. Res. Soc. Symp. Proc. 361, 155–166 (1995)
12. J.M. Elson, J.M. Bennett, J. Opt. Soc. Am. 69(1), 31–47 (1979)10.1364/JOSA.69.000031 ↗
13. M.B. Sinclair, D. Dimos, B.G. Potter Jr, R.W. Schwartz, J. Am. Ceram. Soc. 78(8), 2027–2032 (1995)10.1111/j.1151-2916.1995.tb08614.x ↗
14. D. Rönnow, A. Roos, Appl. Opt. 33(34), 7918–7927 (1994)10.1364/AO.33.007918 ↗
15. R. Apetz, P.B. van Bruggen, J. Am. Ceram. Soc. 86(3), 480–486 (2003)10.1111/j.1151-2916.2003.tb03325.x ↗
16. M.B. Sinclair, D. Dimos, B.G. Potter Jr, R.W. Swhwartz, C.D. Buchheit, Integr. Ferroelectr. 11, 25–34 (1995)10.1080/10584589508013576 ↗
17. C. Rockstuhl, S. Fahr, F. Lederer, F.-J. Haug, T. Söderström, S. Nicolay, M. Despeisse, C. Ballif, J. Appl. Phys. 98, 051102 (2011)
18. S. Schröder, A. Duparre, L. Coriand, A. Tunnemann, D.H. Penalver, J.E. Harvey, Opt. Express 19(10), 9820–9835 (2011)10.1364/OE.19.009820 ↗
19. J. Puustinen, J. Lappalainen, J. Hiltunen, V. Lantto, J. Eur. Ceram. Soc. 30, 429–434 (2010)10.1016/j.jeurceramsoc.2009.05.047 ↗
20. D. Domine, F.J. Haug, C. Battaglia, C. Balif, J. Appl. Phys. 107, 044504 (2010)10.1063/1.3295902 ↗
21. K. Jäger, M. Zeman, Appl. Phys. Lett. 95, 171108 (2009)10.1063/1.3254239 ↗
22. K. Jäger, M. Fisher, R.A.C.M.M. van Saaij, M. Zeman, J. Appl. Phys. 111, 0083108 (2012)10.1063/1.4704372 ↗
23. C.C. Lin, W.L. Liu, C.Y. Hsieh, J. Appl. Phys. 109, 014508 (2011)10.1063/1.3530684 ↗
24. J. Lappalainen, V. Lantto, Appl. Surf. Sci. 154–155, 118–122 (2000)10.1016/S0169-4332(99)00383-9 ↗
25. J. Lappalainen, J. Frantti, V. Lantto, Appl. Surf. Sci. 142, 407–412 (1999)10.1016/S0169-4332(98)00711-9 ↗
26. G. Burns, B.A. Scott, Phys. Rev. B 7, 3088–3101 (1973)10.1103/PhysRevB.7.3088 ↗
27. M. Deluca, H. Fukumura, N. Tonari, C. Capiani, N. Hasuike, K. Kisoda, C. Galassi, H. Harima, J. Raman, Spectroscopy 42, 488–495 (2011)
28. J. Puustinen, J. Lappalainen, V. Lantto, Thin Solid Films 516, 6458–6463 (2008)10.1016/j.tsf.2008.02.046 ↗
29. J. Puustinen, J. Lappalainen, J. Hiltunen, V. Lantto, Ferroelectrics 370, 46–56 (2008)10.1080/00150190802384336 ↗
30. L.B. Freund, S.B. Suresh, Thin Film Materials: Stress, Defect Formation and Surface Evolution (Cambridge University Press, Cambridge, 2003)
31. R. Panat, K.J. Hsia, D.G. Cahill, J. Appl. Phys. 97, 013521 (2005)10.1063/1.1827920 ↗
32. J.C. Stover, Optical Scattering: Measurement and Analysis (McGraw-Hill, Maidenheach, 1990)
33. J.M. Bennett, L. Mattsson, Introduction to Surface Roughness and Scattering, 2nd edn. (Optical society of America, Washington DC, 1999)
34. W. Ma, C. Yang, A.J. Heeger, Adv. Mater. 19, 1387–1390 (2007)10.1002/adma.200601933 ↗
35. A. Roos, D. Rönnow, Appl. Opt. 33(34), 7908–7917 (1994)10.1364/AO.33.007908 ↗
36. D. Bao, X. Yao, N. Wakiya, K. Shinozaki, N. Mizutani, Appl. Phys. Lett. 79, 3767–3769 (2001)10.1063/1.1423788 ↗
37. J. Lappalainen, J. Frantti, J. Hiltunen, V. Lantto, M. Kakihana, Ferroelectrics 335, 149–158 (2006)10.1080/00150190600689720 ↗
38. J. Lappalainen, J. Frantti, V. Lantto, J. Appl. Phys. 82(7), 3469–3477 (1997)10.1063/1.365663 ↗
39. J. Lappalainen, S. Ivanov, V. Lantto, J. Appl. Phys. 92(10), 6153–6159 (2002)10.1063/1.1515954 ↗
40. J. Tuominen, J. Lappalainen, J. Hiltunen, J. Ollila, V. Lantto, J. Opt. A Pure Appl. Opt. 8, 398–404 (2006)10.1088/1464-4258/8/7/S17 ↗