Evaluation of the Quality of BGA Solder Balls in FCBGA Packages Subjected to Thermal Cycling Reliability Test Using Laser Ultrasonic Inspection Technique

In modern integrated circuit (IC) packaging, it is difficult to perceive and evaluate the quality of the solder ball interconnections due to their complex hidden physical configuration and miniaturization. Laser ultrasonic inspection (LUI) technique is a novel, nondestructive, and noncontact method that has achieved great success in evaluating the quality of interconnections in chip-scale and ball-grid array (BGA) packages. In this article, an enhanced dual-fiber array LUI system is used to evaluate the quality of BGA solder balls in advanced industrial flip-chip BGA packages subjected to thermal cycling reliability tests. LUI results are validated with electrical testing, scanning electron microscope (SEM), and dye-and-pry results. LUI results are well correlated with the intermetallic compound cracks in BGA solder balls observed using SEM, and dye-and-pry. This study demonstrates the feasibility of using the LUI system for one of the modern IC packages and the potential to use the LUI system for future advanced IC packages such as 3-D packaging.