Solder Joint Geometry Effects on Thermomechanical Fatigue Lifetime of End-Capped Chip Component Assemblies
Source abstract
Abstract
Electronic component assemblies are exposed to thermal cycles that lead to the thermomechanical fatigue of the solder joints. The effect of the joint geometry on the fatigue lifetime of the assembly is investigated for rectangular end-capped chip components in order to both increase the predictive capabilities of integrity assessment schemes and to guide toward more durable designs. A two-step approach is developed including two models considering the region of the joint underneath the component and the filet, respectively. Local values of the inelastic strain energy density are extracted from finite element (FE) simulations. Phenomenological failure power-law models are identified based on experimental data and previously developed cohesive zone model (CZM) describing the fatigue cracking process. The analysis proves that the filet and its shape play a primary role in setting the fatigue lifetime of the solder layer.
Source: openalex_inverted_index · Quality: baseline
Research context
OpenAlex topics: Electronic Packaging and Soldering Technologies · Mechanical Behavior of Composites · Fatigue and fracture mechanics
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
Affiliations
Institute of Mechanics, Materials and Civil Engineering, IMAP, UCLouvain, Louvain-la-Neuve, Belgium
Thales Alenia Space Belgium, Mont-sur-Marchienne, Belgium
Funding
Service Public de Wallonie-Wallonie recherche through the project “Stress”
References (36)
Show source-provided references
1. Fatigue properties of solder joints
2. 10.1109/33.4900510.1109/33.49005 ↗
3. 10.1109/6144.97496410.1109/6144.974964 ↗
4. 10.1007/s10854-014-1711-y10.1007/s10854-014-1711-y ↗
5. 10.1016/j.ijfatigue.2022.10729810.1016/j.ijfatigue.2022.107298 ↗
6. 10.1109/ECTC.2004.131941910.1109/ECTC.2004.1319419 ↗
7. 10.1109/ICEPT.2017.804671410.1109/ICEPT.2017.8046714 ↗
8. 10.1109/TCAPT.2003.81508910.1109/TCAPT.2003.815089 ↗
9. 10.1109/ITHERM.1996.53456110.1109/ITHERM.1996.534561 ↗
10. 10.1109/ITHERM.1998.68955010.1109/ITHERM.1998.689550 ↗
11. 10.1007/s11664-016-4773-110.1007/s11664-016-4773-1 ↗
12. 10.1016/j.promfg.2020.01.15110.1016/j.promfg.2020.01.151 ↗
13. 10.1109/ICEPT.2009.527061210.1109/ICEPT.2009.5270612 ↗
14. 10.1115/1.279208710.1115/1.2792087 ↗
15. 2022
16. 10.6028/jres.058.02710.6028/jres.058.027 ↗
17. 10.1016/0045-7825(90)90131-510.1016/0045-7825(90)90131-5 ↗
18. 10.1115/1.141376410.1115/1.1413764 ↗
19. 10.1115/1.153617110.1115/1.1536171 ↗
20. 10.1109/TCAPT.2006.87589310.1109/TCAPT.2006.875893 ↗
21. 10.1115/1.128612010.1115/1.1286120 ↗
22. 10.1016/S0167-6636(02)00131-X10.1016/S0167-6636(02)00131-X ↗
23. Solder reliability solutions: From LCCCs to area-array assemblies
24. 10.1016/j.mee.2012.09.01410.1016/j.mee.2012.09.014 ↗
25. 10.1016/j.microrel.2005.01.00810.1016/j.microrel.2005.01.008 ↗
26. 10.1109/ECTC.2001.92797410.1109/ECTC.2001.927974 ↗
27. 10.1109/TDMR.2015.246272610.1109/TDMR.2015.2462726 ↗
28. 10.1109/TDMR.2003.82005610.1109/TDMR.2003.820056 ↗
29. 2022
30. 10.1016/S1359-6462(99)00164-510.1016/S1359-6462(99)00164-5 ↗
31. 10.1016/S0026-2714(99)00061-X10.1016/S0026-2714(99)00061-X ↗
32. 10.1115/1.404340510.1115/1.4043405 ↗
33. Experimental correlations of an energy-based fatigue life prediction method for solder joints
34. Solder joints in electronics: Design for reliability
35. 10.1109/EMAP.2000.90414310.1109/EMAP.2000.904143 ↗
36. 10.1147/rd.133.026610.1147/rd.133.0266 ↗