A Hybrid De-Embedding Technique of Eye Diagram Measurement for High-Speed Digital Interconnections
Source abstract
Abstract
By a modeling technique of equivalent lumped circuit for high-speed interconnections, an innovative method is proposed to predict the physical intrinsic eye diagram. Such a technique is based on the measured impedance profile results of time-domain reflectometry, which includes the electric characteristics both of the connector itself and testing jigs. The latter's are to be removed to leave the connector's part only for the eye diagram prediction. This method can be verified further by SPICE simulation and measurement in this paper.
Source: openalex_inverted_index · Quality: baseline
Research context
OpenAlex topics: Microwave and Dielectric Measurement Techniques · Electromagnetic Compatibility and Noise Suppression · Microwave Engineering and Waveguides
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
Affiliations
Graduate Institute of Communication Engineering, Tatung University, Taipei, Taiwan
References (15)
Show source-provided references
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