Effects of Solder Paste Volume and Reflow Profiles on the Thermal Cycling Performance of Mixed SnAgCu/SnPb Solder Joints
Source abstract
Abstract
Manufacturers of most high-reliability microelectronics products are still exempt from the requirement to eliminate Pb from their soldering process, and neither their components nor their printed circuit boards can always survive a lead-free reflow profile. When faced with the need to incorporate a lead-free ball grid array or chip-scale package into one of their products, they are thus faced with three alternatives: attaching it separately using a rework station to establish a localized lead free profile; reballing the component with eutectic SnPb solder; or soldering it to the board with a eutectic SnPb solder paste to produce high-Sn joints with a few percent of Pb. Any of these approaches may affect the final reliability of the assembly in its own way, and comparisons between them by accelerated testing are confounded by very different acceleration factors. Optimization of solder paste volumes and reflow profiles for mixed soldering is of course less affected by this, but common experiences have been that optimized mixing requires a typical lead-free reflow profile. This clearly defeats the purpose of mixing in many cases. Two different sets of experiments were conducted to assess the consequences of soldering SnAgCu (SAC) balls with a eutectic SnPb paste for the thermal fatigue resistance of the resulting solder joints. The first experiment addressed effects of solder paste volume and common reflow profile alternatives. Based on the results of this, the second set of experiments involved the development of an improved low-temperature profile and the comparison of this with common SnPb and lead-free profiles in terms of thermal cycling performance. Five different high and moderate strain area array components were tested with SnPb, SAC, and mixed SAC/SnPb solder joints, and the results are discussed on the basis of known test parameter dependencies and trends. The improved profile was shown to optimize the performance of the mixed joints, but indications are that these may still compare poorly to pure eutectic ones for some components. All five components may have shorter lives with lead-free than with SnPb joints in service.
Source: openalex_inverted_index · Quality: baseline
Research context
OpenAlex topics: Electronic Packaging and Soldering Technologies · 3D IC and TSV technologies · Advanced Welding Techniques Analysis
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (49)
Show source-provided references
1. 10.1109/ECTC.2006.164584910.1109/ECTC.2006.1645849 ↗
2. clech · Lead-Free Solder Interconnect Reliability · 2005
3. 10.1108/0954091061064708010.1108/09540910610647080 ↗
4. 10.1016/j.microrel.2006.02.00110.1016/j.microrel.2006.02.001 ↗
5. How to assess the effect of time at operating temperature on the service life of lead free solder joints
6. 10.1109/TDMR.2007.91225310.1109/TDMR.2007.912253 ↗
7. 10.1016/j.microrel.2007.12.00210.1016/j.microrel.2007.12.002 ↗
8. Optimization of dwell time for accelerated thermal cycling of Sn3.0Ag0.5Cu Pb-free interconnects
9. 10.1109/ECTC.2004.131940910.1109/ECTC.2004.1319409 ↗
10. Accelerated thermal cycling: Is it different for lead-free solder?
11. 10.1007/978-0-387-48433-4_1510.1007/978-0-387-48433-4_15 ↗
12. 10.1115/1.400386310.1115/1.4003863 ↗
13. 10.1016/j.microrel.2004.06.00710.1016/j.microrel.2004.06.007 ↗
14. Lead free to SnPb BGA reballing process and reliability
15. 10.1108/0305612071075020110.1108/03056120710750201 ↗
16. Thermomechanical fatigue behavior of selected lead-free solders
17. Reliability evaluations of lead-free SnAgCu PBGA676 components using tin-lead and lead-free SnAgCu solder paste
18. An acceleration model for Sn-Ag-Cu solder joint reliability under various thermal cycle conditions
19. 10.1109/ECTC.2008.454996010.1109/ECTC.2008.4549960 ↗
20. 10.1109/ECTC.2006.164576010.1109/ECTC.2006.1645760 ↗
21. Effects of corner/edge bonding and underfill properties on the thermal cycling performance of lead free BGA assemblies
22. Lead-free and mixed assembly solder joint reliability trends
23. 10.1007/s11664-004-0083-010.1007/s11664-004-0083-0 ↗
24. 10.1007/s11837-005-0135-910.1007/s11837-005-0135-9 ↗
25. 10.1109/ECTC.2008.455001210.1109/ECTC.2008.4550012 ↗
26. 10.1016/S0927-796X(02)00007-410.1016/S0927-796X(02)00007-4 ↗
27. 10.1007/s11837-004-0109-310.1007/s11837-004-0109-3 ↗
28. 10.1016/j.msea.2005.08.14210.1016/j.msea.2005.08.142 ↗
29. 10.1007/s11664-001-0144-610.1007/s11664-001-0144-6 ↗
30. 10.1016/j.msea.2005.02.00810.1016/j.msea.2005.02.008 ↗
31. Reliability study and solder joint microstructure of various SnAgCu ceramic ball grid array (CBGA) geometries and alloys
32. 10.1007/s11664-003-0137-810.1007/s11664-003-0137-8 ↗
33. Effect of dwell time on the life of lead free BGA joints in thermal cycling
34. Process development with temperature sensitive components in server applications
35. Reliability assessment of reballed BGAs
36. Backward compatibility, are we ready—A case study
37. Reliability of lead-free BGA with Sn-Pb solder paste for harsh environments
38. 10.1557/mrs2007.23610.1557/mrs2007.236 ↗
39. A comprehensive analysis of the thermal fatigue reliability of SnPb and Pb free plastic ball grid arrays (PBGA) using backward and forward compatible assembly processes
40. 10.1109/ECTC.2009.507404510.1109/ECTC.2009.5074045 ↗
41. 10.1007/s11664-004-0096-810.1007/s11664-004-0096-8 ↗
42. 10.1109/TEPM.2002.80164910.1109/TEPM.2002.801649 ↗
43. 10.1007/s11664-004-0090-110.1007/s11664-004-0090-1 ↗
44. 10.1109/ECTC.2008.454995610.1109/ECTC.2008.4549956 ↗
45. 10.1109/ECTC.2007.37386710.1109/ECTC.2007.373867 ↗
46. 10.1109/TCHMT.1983.113618310.1109/TCHMT.1983.1136183 ↗
47. Interconnect reliability in medical microelectronics applications
48. Reliability of the aging lead free solder joint
49. Solder joint microstructure and reliability study of ceramic ball grid array (CBGA) components