Practical Early Quality–Reliability Analysis of Microwirewound Resistor Transition Zone

Practical systemic early failure analysis (SEFA) discovered significant safety, quality, and reliability (SQR) deficiency created by a tiny obscure transition zone (TZ) located among conventional segments (contacts, winding, and packaging). TZ inherent vulnerabilities cause confusing, persistent, and dangerous early failures (TZEFs) which traditional methods overlook and/or misinterpret. TZ is the weak link determining risks, losses, and the costs of otherwise enhanced segments, parts, and systems. SEFA performed within a closed analytical loop (CAL) characterized, prioritized, and classified TZEF modes. Improvements resolved TZEF effectively and efficiently, protected new models, and illustrated several SEFA-CAL principles versus traditional ones.