journal article·2006-02

Method for reducing debris and thermal destruction in femtosecond laser processing by applying transparent coating

D. Kawamura, A. Takita, Y. Hayasaki, N. Nishida

Applied Physics A· Volume 82· Issue 3
Publisher page

Abstract

A cavity processed by a tightly focused femtosecond laser pulse is surrounded by a ring-shaped protrusion, debris, and small droplets. In order to reduce these undesired damages, we propose processing with a coating of transparent material on a target material. PMMA (poly-methyl methacrylate) with the thickness that its surface is not ablated by a single pulse irradiation reduces dissolution and vaporization caused by the interaction between a high-density hot vapor plume and the target material. Furthermore, the material at the target surface does not escape freely due to the coating layer. As a result, a submicrometer-sized cavity is produced with a reduction of debris and a smaller thermal-destruction area.
Source: openaire · Quality: candidate unverified · Source record ↗

Research context

OpenAlex topics: Laser Material Processing Techniques · Nonlinear Optical Materials Studies · Ocular and Laser Science Research

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

References (24)

Show source-provided references
1. Du D, Liu X, Korn G, Squier J, Mourou G (1994) Appl. Phys. Lett. 64:307110.1063/1.111350 ↗
2. Kumagai H, Midorikawa K, Toyoda K, Nakamura S, Okamoto T, Obara M (1994) Appl. Phys. Lett. 65:185010.1063/1.112863 ↗
3. Glezer EN, Mazur E (1997) Appl. Phys. Lett. 71:88210.1063/1.119677 ↗
4. Rudolph P, Bonse J, Krüger J, Kautek W (1999) Appl. Phys. A 69:76310.1007/s003390051524 ↗
5. Schaffer CB, Brodeur A, Garcia JF, Mazur E (2001) Opt. Lett. 26:9310.1364/OL.26.000093 ↗
6. Juodkazis S, Matsuo S, Misawa H, Mizeikis V, Marcinkevicius A, Sunm H-B, Tokuda Y, Takahashi M, Yoko T, Nishii J (2002) Appl. Surf. Sci. 197:70510.1016/S0169-4332(02)00397-5 ↗
7. Luo L, Li C, Wang D, Yang H, Jiang H, Gong Q (2002) Appl. Phys. A 74:49710.1007/s003390100901 ↗
8. Borowiec A, Mackenzie M, Weathyrly GC, Haugen HK (2003) Appl. Phys. A 76:20110.1007/s003390201409 ↗
9. Schaffer CB, Jamison AO, Mazur E (2004) Appl. Phys. Lett. 84:144110.1063/1.1650876 ↗
10. Hayasaki Y, Takagi H, Takita A, Yamamoto H, Nishida N, Misawa H (2004) Jpn. J. Appl. Phys. 43:808910.1143/JJAP.43.8089 ↗
11. Yamasaki K, Juodkazis S, Watanabe M, Sun H-B, Matsuo S, Misawa H (2000) Appl. Phys. Lett. 76:100010.1063/1.125919 ↗
12. Takita A, Yamamoto H, Hayasaki Y, Nishida N, Misawa H (2005) Opt. Express 13:456010.1364/OPEX.13.004560 ↗
13. Miura K, Qiu J, Inouye H, Mitsuyum T, Hirao K (1997) Appl. Phys. Lett. 71:332910.1063/1.120327 ↗
14. Li Y, Watanabe W, Yamada K, Shinagawa T, Itoh K, Nishii J, Jiang Y (2002) Appl. Phys. Lett. 80:150810.1063/1.1457524 ↗
15. Watanabe W, Kuroda D, Itoh K, Nishii J (2002) Opt. Express 10:97810.1364/OE.10.000978 ↗
16. Sun H-B, Matsuo S, Misawa H (1999) Appl. Phys. Lett. 74:76810.1063/1.123305 ↗
17. Kondo T, Matsuo S, Juodkazis S, Misawa H (2001) Appl. Phys. Lett. 79:72510.1063/1.1391232 ↗
18. Kim H, Postlwaite JC, Zyung T, Dlott DD (1989) Appl. Phys. Lett. 54:227410.1063/1.101521 ↗
19. Herrmann RFW, Gerlach J, Campbell EEB (1998) Appl. Phys. A 66:3510.1007/s003390050634 ↗
20. Chichkov BN, Momma C, Notle S, von Alvenslben F, Tünnermann A (1996) Appl. Phys. A 63:10910.1007/BF01567637 ↗
21. Zozulya AA, Diddams SA (1999) Opt. Express 4:33610.1364/OE.4.000336 ↗
22. Korte F, Adams S, Egbert A, Fallnich C, Ostendorf A, Nolte S, Will M, Ruske J-P, Chichkov BN, Tünnermann A (2000) Opt. Express 7:4110.1364/OE.7.000041 ↗
23. Wu Z, Jiang H, Zhang Z, Sun Q, Yang H, Gong Q (2002) Opt. Express 10:124410.1364/OE.10.001244 ↗
24. Korte F, Serbin J, Koch J, Egbert A, Fallnich C, Ostendorf A, Chichkon BN (2003) Appl. Phys. A 77:22910.1007/s00339-003-2110-z ↗