journal article·1985-12

Experimental and theoretical investigations into the origin of cross-contamination effects observed in a quadrupole-based SIMS instrument

K. Wittmaack

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OpenAlex topics: Ion-surface interactions and analysis · Integrated Circuits and Semiconductor Failure Analysis · Electron and X-Ray Spectroscopy Techniques

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References (25)

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12. W. Reuter, K. Wittmaack: Appl. Surf. Sci.5, 221 (1980)10.1016/0378-5963(80)90063-X ↗
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14. W. Eckstein: Private communication (1985)
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25. K. Wittmaack: J. Vac. Sci. Technol. A3, 1350 (1985)10.1116/1.572775 ↗