Sub-500-nm patterning of glass by nanosecond KrF excimer laser ablation
Source abstract
Abstract
The surface of flint glass of type F2 is patterned by nanosecond KrF excimer laser ablation. Strong UV absorption provides a comparatively low ablation threshold and precise ablation contours. By using a two-grating interferometer, periodic surface patterns with 330 nm period and 100 nm modulation depth are obtained. This method enables the fabrication of 7 mm×13 mm wide grating areas with perfectly aligned grooves without the need of high-precision sample positioning. By double exposure, crossed gratings with adjustable depths in the two orthogonal directions can be generated.
Source: openaire · Quality: candidate unverified · Source record ↗
Research context
OpenAlex topics: Laser Material Processing Techniques · Nonlinear Optical Materials Studies · Surface Roughness and Optical Measurements
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (18)
Show source-provided references
1. A.A. Tseng, Y.-T. Chen, C.-L. Chao, K.-J. Ma, T.P. Chen, Opt. Lasers Eng. 45, 975 (2007)10.1016/j.optlaseng.2007.04.003 ↗
2. B. Keiper, H. Exner, U. Löschner, T. Kuntze, J. Laser Appl. 12, 189 (2000)10.2351/1.1309553 ↗
3. S. Pissadakis, L. Reekie, M. Hempstead, M.N. Zervas, J.S. Wilkinson, Appl. Phys. A 69, S739 (1999)10.1007/s003390051009 ↗
4. J. Ihlemann, M. Schulz-Ruhtenberg, T. Fricke-Begemann, J. Phys. Conf. Ser. 59, 206 (2007)10.1088/1742-6596/59/1/045 ↗
5. J. Ihlemann, S. Müller, S. Puschmann, D. Schäfer, M. Wei, J. Li, P.R. Herman, Appl. Phys. A 76, 751 (2003)10.1007/s00339-002-1467-8 ↗
6. S.R. Jackson, W.J. Metheringham, P.E. Dyer, Appl. Surf. Sci. 86, 223 (1995)10.1016/0169-4332(94)00415-3 ↗
7. K. Kawamura, N. Sarukura, M. Hirano, N. Ito, H. Hosono, Appl. Phys. Lett. 79, 1228 (2001)10.1063/1.1398618 ↗
8. X. Ding, Y. Kawaguchi, T. Sato, A. Narazaki, R. Kurosaki, H. Niino, J. Photochem. Photobiol. A, Chem. 166, 129 (2004)10.1016/j.jphotochem.2004.04.040 ↗
9. B. Hopp, C. Vass, T. Smausz, Z. Bor, J. Phys. D, Appl. Phys. 39, 4843 (2006)10.1088/0022-3727/39/22/015 ↗
10. J. Ihlemann, Appl. Phys. A 93, 65 (2008)10.1007/s00339-008-4663-3 ↗
11. B. Wolff-Rottke, H. Schmidt, J. Ihlemann, Microstructuring of glass with excimer lasers, in Laser Treatment of Materials, ed. by B.L. Mordike (DGM Informationsgesellschaft mbH, Oberursel, 1992), p. 615. ISBN 3-88355-185-6
12. C. Contardi, E.R. Taylor, A. Fu, J. Non-Cryst. Solids 291, 113 (2001)10.1016/S0022-3093(01)00796-7 ↗
13. J. Békési, J. Meinertz, J. Ihlemann, P. Simon, J. Laser Micro Nanoeng. 2, 221 (2007)10.2961/jlmn.2007.03.0011 ↗
14. J. Békési, J. Meinertz, J. Ihlemann, P. Simon, Appl. Phys. A 93, 27 (2008)10.1007/s00339-008-4680-2 ↗
15. P. Zahariev, N. Mechkarov, G. Danev, J. Ihlemann, Appl. Phys. A 95, 639 (2009)10.1007/s00339-009-5143-0 ↗
16. P.E. Dyer, S.M. Maswadi, C.D. Walton, M. Ersoz, P.D.I. Fletcher, V.N. Paunov, Appl. Phys. A 77, 391 (2003)10.1007/s00339-002-1936-0 ↗
17. P.E. Dyer, C.D. Walton, Appl. Phys. A 79, 721 (2004)10.1007/s00340-004-1628-x ↗
18. Schott Datenblatt F2 620364.360, 22 February 2007