Experimental study of transmission enhancement of evanescent waves through silver films assisted by surface plasmon excitation
Source abstract
Abstract
In this paper, we investigated an essential precursor of superlensing: enhancing the transmission of evanescent waves assisted by excitation of surface plasmon. Using natural roughness as a well characterized grating, the transmission of evanescent waves is studied through silver thin films of increasing thickness. Measurements and calculations are performed in the wavelength range of 514.5 nm to 351.1 nm where the real part of the permittivity of silver is negative. Pronounced peaks due to surface-plasmon excitations are observed in the transmission spectra. We found the transmission of evanescent waves rapidly grows with the film thickness up to about 50 nm, after which it decays as loss becomes significant. As the permittivity of a silver slab approaches -1, we experimentally observed a broadening of surface plasmon bandwidth. Our study indicates a pathway to access the deep subwavelength features by metamaterial superlens.
Source: openaire · Quality: candidate unverified · Source record ↗
Research context
OpenAlex topics: Metamaterials and Metasurfaces Applications · Plasmonic and Surface Plasmon Research · Optical Coatings and Gratings
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (33)
Show source-provided references
1. J.B. Pendry: Phys. Rev. Lett. 85, 3966 (2000)10.1103/PhysRevLett.85.3966 ↗
2. H. Raether: Surface Plasmons, Springer-Verlag, Berlin (1988)10.1007/BFb0048323 ↗
3. H. Raether: Excitation of Plasmons and Interband Transitions by Electrons, Springer-Verlag, Berlin (1980) Chapt. 10
4. E. Kretschmann: Z. Phys. 241, 313 (1971)10.1007/BF01395428 ↗
5. E. Kroeger, E. Kretschmann: Z. Physik 237, 1 (1970)10.1007/BF01400471 ↗
6. E. Kretschmann: Opt. Comm. 5, 331 (1972)10.1016/0030-4018(72)90026-0 ↗
7. D.R. Smith, D. Schurig, M. Rosenbluth, S. Schultz, S.A. Ramakrishna, J.B. Pendry: Appl. Phys. Lett. 82, 1506 (2003)10.1063/1.1554779 ↗
8. S.A. Ramakrishna, J.B. Pendry, D. Schurig, D.R. Smith, S. Schultz: J. Mod. Optics 49, 1747 (2002)10.1080/09500340110120950 ↗
9. N. Fang, X. Zhang: Appl. Phys. Lett. 82, 161 (2003)10.1063/1.1536712 ↗
10. E.T. Arakawa, M.W. Williams, R.N. Hamm, R.H. Ritchie: Phys. Rev. Lett. 31, 1127 (1973)10.1103/PhysRevLett.31.1127 ↗
11. R.W. Alexander, G.S. Kovener, R.J. Bell: Phys. Rev. Lett. 32, 154 (1974)10.1103/PhysRevLett.32.154 ↗
12. D. Hornauer: Opt. Comm. 16, 76 (1976)10.1016/0030-4018(76)90054-7 ↗
13. I. Pockrand, H. Raether: Appl. Opt. 16, 1784 (1977)10.1364/AO.16.001784 ↗
14. A.A. Maradudin, D.L. Mills: Phys. Rev. B11, 1392 (1975)10.1103/PhysRevB.11.1392 ↗
15. O.S. Heavens: Optical Properties of Thin Solid Films, Dover, Mineola (1991)
16. S. Hayashi, T. Kume, T. Amano, K. Yamamoto: Jpn. J. Appl. Phys. 35, L331 (1996)10.1143/JJAP.35.L331 ↗
17. J. Moreland, A. Adams, P.K. Hansma: Phys. Rev. B 25, 2297 (1982)10.1103/PhysRevB.25.2297 ↗
18. P.B. Johnson, R.W. Christy: Phys. Rev. B 6, 4370 (1972)10.1103/PhysRevB.6.4370 ↗
19. Oriel Instruments, The Book of Photon Tools, (2002) Chapt. 15
20. J.J. Burke, G.I. Stegeman, T. Tamir: Phys. Rev. B 33, 5186 (1986)10.1103/PhysRevB.33.5186 ↗
21. P. Dawson, B.A.F. Puygranier, J.-P. Goudonnet: Phys. Rev. B 63, 205410 (2001)10.1103/PhysRevB.63.205410 ↗
22. M. Born, E. Wolf (Eds.): Principles of Optics, Pergamon Press, fourth edn. (1970)
23. V.G. Veselago: Sov. Phys. Usp. 10, 509 (1968)10.1070/PU1968v010n04ABEH003699 ↗
24. R.A. Shelby, D.R. Smith, S. Schultz: Science 292, 77 (2001)10.1126/science.1058847 ↗
25. H.J. Simon, J.K. Guha: Opt. Comm. 18, 391 (1976)10.1016/0030-4018(76)90158-9 ↗
26. J.B. Pendry: In Photonic Crystals and Light Localization in the 21st Century, ed. by C.M. Soukoulis, NATO Science Series (2001)
27. M. Kahl, E. Voges: Phys. Rev. B 61, 14078 (2000)10.1103/PhysRevB.61.14078 ↗
28. J.C. Quail, J.G. Rako, H.J. Simon, R.T. Deck: Phys. Rev. Lett. 50, 1987 (1983)10.1103/PhysRevLett.50.1987 ↗
29. F. Moresco, M. Rocca, T. Hildebrandt, M. Henzler: Phys. Rev. Lett. 83, 2238 (1999)10.1103/PhysRevLett.83.2238 ↗
30. H.J. Lezec, A. Degiron, E. Devaux, R.A. Linke, L. Martin-Moreno, F.J. Garcia-Vidal, T.W. Ebbesen: Science 297, 820 (2002)10.1126/science.1071895 ↗
31. R.W. Ziolkowski, E. Heyman: Phys. Rev. E64, 056625 (2001)10.1103/PhysRevE.64.056625 ↗
32. N. Fang, Z. Liu, T.-J. Yen, X. Zhang: Opt. Exp. 11, 682 (2003)10.1364/OE.11.000682 ↗
33. Z. Liu, N. Fang, T.-J. Yen, X. Zhang: Appl. Phys. Lett. 83, 5184 (2003)10.1063/1.1636250 ↗