TEM image contrast from antiphase domains in GaAs: Ge(001) grown by MBE
Bibliographic record
Abstract
No abstract is available for this record. The assistant can identify its topic from the title, but cannot infer the study’s results.
Source: Not provided · Quality: missing
Research context
OpenAlex topics: Semiconductor Quantum Structures and Devices · Semiconductor materials and interfaces · Chalcogenide Semiconductor Thin Films
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (21)
Show source-provided references
1. G.A. Baraff, J.A. Appelbaum, D.R. Hamann: Phys. Rev. Lett.38, 237 (1977)10.1103/PhysRevLett.38.237 ↗
2. W.E. Pickett, S.G. Louie, M.L. Cohen: Phys. Rev. B17, 815 (1978)10.1103/PhysRevB.17.815 ↗
3. F. Herman, R.V. Kasowski: Phys. Rev. B17, 672 (1978)10.1103/PhysRevB.17.672 ↗
4. W.A. Harrison, E.A. Kraut, J.R. Waldrop, R.W. Grant: Phys. Rev. B18, 4402 (1978)10.1103/PhysRevB.18.4402 ↗
5. J. Pollmann, S.T. Pantelides: Phys. Rev. B21, 709 (1980)10.1103/PhysRevB.21.709 ↗
6. L.C. Bobb, H. Holloway, K.H. Maxwell: J. Appl. Phys.37, 4687 (1966)10.1063/1.1708118 ↗
7. R.S. Bauer, J.C. McMenamin: J. Vac. Sci. Technol.15, 1444 (1978)10.1116/1.569804 ↗
8. P.M. Petroff, A.C. Gossard, A. Savage, W. Wiegmann: J. Cryst. Growth46, 172 (1979)10.1016/0022-0248(79)90053-8 ↗
9. C.A. Chang, W.K. Chu, E.E. Mendez, L.L. Chang, L. Esaki: J. Vac. Sci. Technol.19, 567 (1981)10.1116/1.571128 ↗
10. C.A. Chang: J. Appl. Phys.53, 1253 (1982)10.1063/1.330542 ↗
11. J.C. Phillips: J. Vac. Sci. Technol.19, 545 (1981)10.1116/1.571123 ↗
12. T.S. Kuan, C.A. Chang: Proc. 10th Intern. Congr. on Electron Microscopy, Hamburg (1982) p. 401; also J. Appl. Phys.54, 4408 (1983)10.1063/1.332688 ↗
13. J.H. Neave, P.K. Larsen, B.A. Joyce, J.P. Gowers, J.F. van der Veen: J. Vac. Sci. Technol. B1, 668 (1983)10.1116/1.582574 ↗
14. S. Amelinckx, R Gevers, G. Remaut, J. Van Landuyt (eds.): InModern Diffraction and Imaging Techniques in Materials Science (North-Holland, Amsterdam 1970) p. 257
15. J.W. Edington:Practical Electron Microscopy in Materials Science, Vol. 3 (Philips Technical Library, Macmillan, London 1975) p. 43
16. J. Taftø, J.C.H. Spence: J. Appl. Cryst.15, 60, (1982)10.1107/S0021889882011352 ↗
17. P.K. Larsen, J.H. Neave, B.A. Joyce: J.Phys. C14, 167 (1981)
18. C. Schiller, J.P. Gowers: Acta Electron.21, 167 (1978)
19. A.Y. Cho: J. Appl. Phys.47, 2841 (1976)10.1063/1.323081 ↗
20. See, for exampleElements of x-ray Diffraction, by B.D. Cullity (Addison-Wesley, Reading, MA 1959) p. 117
21. D.B. Holt: J. Phys. Chem. Solids30, 1297 (1969)10.1016/0022-3697(69)90191-7 ↗