Synthesis and characterization of tin oxide (SnO2) nanocrystalline powders by a simple modified sol–gel route
Source abstract
Abstract
This paper reports the synthesis and characterization of nanocrystalline tin oxide (SnO2) powders by a simple method using a chitosan–polymer complex solution. To obtain SnO2 nanocrystalline powders, the precursor was calcined at 500–600 °C in air for 2 h. The phase composition of calcined samples was studied by X-ray diffraction (XRD). The XRD results confirmed the formation of a SnO2 phase with tetragonal structure. The particle sizes of the powder were found to be 22–23 nm as evaluated by the XRD line broadening method. TEM investigation revealed that the SnO2 samples consist of crystalline particles of 19–21 nm. The corresponding selected area electron diffraction analysis further confirmed the formation of the tetragonal structure of SnO2 without any impurity phases. The optical properties of the samples were explored by Fourier transform infrared spectroscopy, optical absorption and Raman studies. The estimated band gaps of the samples were in the range of 3.44–3.73 eV.
Source: openaire · Quality: candidate unverified · Source record ↗
Research context
OpenAlex topics: Gas Sensing Nanomaterials and Sensors · Transition Metal Oxide Nanomaterials · ZnO doping and properties
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (33)
Show source-provided references
1. L. Kong, J. Ma, Z. Zhu, C. Luan, F. Ji, J. Cryst. Growth 312, 2931 (2010)10.1016/j.jcrysgro.2010.07.019 ↗
2. J. Pal, P. Chauhan, Mater. Charact. 60, 1512 (2009)10.1016/j.matchar.2009.08.007 ↗
3. J. Kaur, J. Shah, R.K. Kotnala, K.C. Verma, Ceram. Int. 38, 5563 (2012)10.1016/j.ceramint.2012.03.075 ↗
4. A.S. Ahmed, A. Azam, M.M. Shafeeq, M. Chaman, S. Tabassum, J. Phys. Chem. Solids 73, 943 (2012)10.1016/j.jpcs.2012.02.030 ↗
5. J. Zhang, L. Gao, J. Solid State Chem. 177, 1425 (2004)10.1016/j.jssc.2003.11.024 ↗
6. R. Al-Gaashani, S. Radiman, N. Tabet, A.R. Daud, Mater. Sci. Eng. B 177, 462 (2012)10.1016/j.mseb.2012.02.006 ↗
7. V. Kumara, S. Sen, K.P. Muthe, N.K. Gaur, S.K. Gupta, J.V. Yakhmi, Sensor Actuat. B 138, 587 (2009)10.1016/j.snb.2009.02.053 ↗
8. D. Wang, X. Chu, M. Gong, Sensor Actuat. B 117, 183 (2006)10.1016/j.snb.2005.11.022 ↗
9. J.K. Choi, I.S. Hwang, S.J. Kim, J.S. Park, S.S. Park, U. Jeong, Y.C. Kang, J.H. Lee, Sensor Actuat. B 150, 191 (2010)10.1016/j.snb.2010.07.013 ↗
10. R. Chen, G.Z. Xing, J. Gao, Z. Zhang, T. Wu, H.D. Sun, Appl. Phys. Lett. 95, 061908 (2009)10.1063/1.3205122 ↗
11. F. Davar, M. Salavati-Niasari, Z. Fereshteh, J. Alloy Compd. 496, 638 (2010)10.1016/j.jallcom.2010.02.152 ↗
12. R.K. Mishra, P.P. Sahay, Ceram. Int. 38, 2295 (2012)10.1016/j.ceramint.2011.10.081 ↗
13. L.A. Patil, M.D. Shinde, A.R. Bari, V.V. Deo, Mater. Sci. Eng. B 176, 579 (2011)10.1016/j.mseb.2010.12.019 ↗
14. L.M. Fang, X.T. Zu, Z.J. Li, S. Zhu, C.M. Liu, W.L. Zhou, L.M. Wang, J. Alloy Compd. 454, 261 (2008)10.1016/j.jallcom.2006.12.014 ↗
15. L. Fang, X. Zu, C. Liu, Z. Li, G. Peleckis, S. Zhu, H. Liu, L. Wang, J. Alloy Compd. 491, 679 (2010)10.1016/j.jallcom.2009.11.044 ↗
16. T. Krishnakumar, R. Jayaprakash, M. Parthibavarman, A.R. Phani, V.N. Singh, B.R. Mehta, Mater. Lett. 63, 896 (2009)10.1016/j.matlet.2009.01.032 ↗
17. D. Chu, Y. Masuda, T. Ohji, K. Kato, Chem. Eng. J. 168, 955 (2011)10.1016/j.cej.2011.02.029 ↗
18. F.-Y. Shih, K.-Z. Fung, Electrochim. Acta 51, 6533 (2006)10.1016/j.electacta.2006.04.039 ↗
19. F.-Y. Shih, K.-Z. Fung, J. Power Sources 159, 1370 (2006)10.1016/j.jpowsour.2005.12.021 ↗
20. B.D. Cullity, S.R. Stock, Elements of X-ray Diffraction, 3rd edn. (Prentice Hall, New Jersey, 2001), p. 388
21. D.L. Chen, L. Gao, J. Colloid Interf. Sci. 279, 137 (2004)10.1016/j.jcis.2004.06.052 ↗
22. J.R. Zhang, L. Gao, Inorg. Chem. Commun. 7, 91 (2004)10.1016/j.inoche.2003.10.012 ↗
23. B. Zhang, Y. Tian, J.X. Zhang, W. Cai, Mater. Lett. 65, 1204 (2011)10.1016/j.matlet.2011.01.052 ↗
24. F. Gervais, W. Kress, Phys. Rev. B 31, 4809 (1985)10.1103/PhysRevB.31.4809 ↗
25. C. Xu, G. Xu, Y. Liu, X. Zhao, G. Wang, Scripta Mater. 46, 789 (2002)10.1016/S1359-6462(02)00077-5 ↗
26. S. Das, S. Kar, S. Chaudhuri, J. Appl. Phys. 99, 114303 (2006)10.1063/1.2200449 ↗
27. S.H. Sun, G.W. Meng, G.X. Zhang, T. Gao, B.Y. Geng, L.D. Zhang, J. Zuo, Chem. Phys. Lett. 376, 103 (2003)10.1016/S0009-2614(03)00965-5 ↗
28. J. Tauc, R. Grigorovici, A. Vancu, Phys. Solid State 15, 627 (1966)10.1002/pssb.19660150224 ↗
29. E. Ziegler, A. Heinrich, H. Oppermann, G. StÖver, Phys. Solid State 66, 635 (1981)10.1002/pssa.2210660228 ↗
30. D. Barreca, G. Bruno, A. Gasparotto, M. Losurdo, E. Tondello, Mater. Sci. Eng. C 23, 1013 (2003)10.1016/j.msec.2003.09.103 ↗
31. V. Liverini, A. Rutz, U. Keller, S. SchÖn, J. Appl. Phys. 99, 113103 (2006)10.1063/1.2200877 ↗
32. G.J. Fang, D. Li, B.-L. Yao, Thin Solid Films 418, 156 (2002)10.1016/S0040-6090(02)00733-2 ↗
33. A. Azam, A.S. Ahmed, S. Habib, A.H. Naqvi, J. Alloy Compd. 523, 83 (2012)10.1016/j.jallcom.2012.01.072 ↗