journal article·2008-05

A time-of-flight spectrometer for angle-resolved detection of low energy electrons in two dimensions

P.S. Kirchmann, L. Rettig, D. Nandi, U. Lipowski, M. Wolf, U. Bovensiepen

Applied Physics A· Volume 91· Issue 2
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Abstract

We have developed a time-of-flight photoelectron spectrometer that simultaneously analyzes low energy electrons photoemitted from solid surfaces in an energy- and angle-resolved manner. To achieve this, a field free drift tube with an acceptance angle of 22° is combined with two-dimensional position-sensitive detection of photoelectrons, which is realized by a microchannel plate stack and a delay-line anode for position encoding. Here, we present the design considerations and principles of operation including analysis of multiple events per light pulse. The performance of the spectrometer is demonstrated by photoemission from a Cu(111) single crystalline surface by UV femtosecond laser pulses at 6.2 eV photon energy.
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Research context

OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Advanced Electron Microscopy Techniques and Applications · Advancements in Photolithography Techniques

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