A time-of-flight spectrometer for angle-resolved detection of low energy electrons in two dimensions
Source abstract
Abstract
We have developed a time-of-flight photoelectron spectrometer that simultaneously analyzes low energy electrons photoemitted from solid surfaces in an energy- and angle-resolved manner. To achieve this, a field free drift tube with an acceptance angle of 22° is combined with two-dimensional position-sensitive detection of photoelectrons, which is realized by a microchannel plate stack and a delay-line anode for position encoding. Here, we present the design considerations and principles of operation including analysis of multiple events per light pulse. The performance of the spectrometer is demonstrated by photoemission from a Cu(111) single crystalline surface by UV femtosecond laser pulses at 6.2 eV photon energy.
Source: openaire · Quality: candidate unverified · Source record ↗
Research context
OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Advanced Electron Microscopy Techniques and Applications · Advancements in Photolithography Techniques
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (24)
Show source-provided references
1. S.D. Kevan, Angle-Resolved Photoemission (Elsevier, Amsterdam, 1992)
2. S. Hüfner, Photoelectron Spectroscopy (Springer, Berlin, 1995)10.1007/978-3-662-03150-6 ↗
3. P.M. Echenique, R. Berndt, E.V. Chulkov, T. Fauster, A. Goldmann, U. Höfer, Surf. Sci. Rep. 52, 219 (2004)10.1016/j.surfrep.2004.02.002 ↗
4. A. Hotzel, M. Wolf, J.P. Gauyacq, J. Phys. Chem. 104, 8438 (2000)10.1021/jp000989b ↗
5. P.S. Kirchmann, P. Loukakos, U. Bovensiepen, M. Wolf, New J. Phys. 7, 113 (2005)10.1088/1367-2630/7/1/113 ↗
6. M. Weinelt, J. Phys.: Condens. Matter 14, R1099 (2002)10.1088/0953-8984/14/43/202 ↗
7. J. Güdde, U. Höfer, Prog. Surf. Sci. 80, 49 (2005)10.1016/j.progsurf.2005.10.003 ↗
8. A.D. Miller, I. Bezel, K.J. Gaffney, S. Garrett-Roe, S.H. Liu, P. Szymanski, C.B. Harris, Science 297, 1163 (2002)10.1126/science.1073571 ↗
9. N.-H. Ge, C.M. Wong, R.L. Lingle Jr., J.D. McNeill, K.J. Gaffney, C.B. Harris, Science 279, 202 (1998)10.1126/science.279.5348.202 ↗
10. C. Gahl, U. Bovensiepen, C. Frischkorn, M. Wolf, Phys. Rev. Lett. 89, 107402 (2002)10.1103/PhysRevLett.89.107402 ↗
11. J.E. Land, W. Raith, Phys. Rev. Lett. 30, 193 (1973)10.1103/PhysRevLett.30.193 ↗
12. M. Lisowski, P.A. Loukakos, U. Bovensiepen, J. Stähler, C. Gahl, M. Wolf, Appl. Phys. A 78, 165 (2004)10.1007/s00339-003-2301-7 ↗
13. S. Yeom, H.W. Takeda, E. Rotenberg, I. Matsuda, K. Horikoshi, J. Schaefer, C.M. Lee, S.D. Kevan, T. Ohta, T. Nagao, S. Hasegawa, Phys. Rev. Lett. 82, 4898 (1999)10.1103/PhysRevLett.82.4898 ↗
14. T.K. Rügheimer, T. Fauster, F.J. Himpsel, Phys. Rev. B 75, 121401 (2007)10.1103/PhysRevB.75.121401 ↗
15. R. Haight, J. A. Silberman, M.I. Lilie, Rev. Sci. Instrum. 59, 1941 (1988)10.1063/1.1140055 ↗
16. A. Oelsner, O. Schmidt, M. Schicketanz, M. Klais, G. Schönhense, V. Mergel, O. Jagutzki, H. Schmidt-Böcking, Rev. Sci. Instrum. 72, 3968 (2001)10.1063/1.1405781 ↗
17. O. Jagutzki, A. Cerezo, A. Czasch, R. Dörner, M. Hattaß, M. Huang, V. Mergel, U. Spillmann, K. Ullmann-Pfleger, T. Weber, H. Schmidt-Böcking, G.D.W. Smith, IEEE Trans. Nucl. Sci. 49, 2477 (2002)10.1109/TNS.2002.803889 ↗
18. M. Hattass, T. Jalowy, A. Czasch, T. Weber, T. Jahnke, S. Schössler, L.P. Schmidt, O. Jagutzki, R. Dörner, H. Schmidt-Böcking, Rev. Sci. Instrum. 75, 2373 (2004)10.1063/1.1765764 ↗
19. G. Da Costa, F. Vurpillot, A. Bostel, M. Bouet, B. Deconihout, Rev. Sci. Instrum. 76, 013304 (2005)10.1063/1.1829975 ↗
20. http://www.roentdek.com
21. J. Ullrich, R. Moshammer, A. Dorn, R. Dörner, L.P.H. Schmidt, H. Schmidt-Böcking, Rep. Prog. Phys. 66, 1463 (2003)10.1088/0034-4885/66/9/203 ↗
22. S.E. Sobottka, M.B. Williams, IEEE Trans. Nucl. Sci. 35, 348 (1988)10.1109/23.12740 ↗
23. E. Knoesel, A. Hotzel, M. Wolf, J. Electron Spectrosc. Relat. Phenom. 88–91, 577 (1998)10.1016/S0368-2048(97)00178-3 ↗
24. F. Reinert, G. Nicolay, S. Schmidt, D. Ehm, S. Hüfner, Phys. Rev. B 63, 115415 (2001)10.1103/PhysRevB.63.115415 ↗