journal article·2012-10

Nitride memristors

Byung Joon Choi, J. Joshua Yang, M.-X. Zhang, Kate J. Norris, Douglas A. A. Ohlberg, Nobuhiko P. Kobayashi, Gilberto Medeiros-Ribeiro, R. Stanley Williams

Applied Physics A· Volume 109· Issue 1
Publisher page

Abstract

We demonstrate a promising new material system for ionic resistive switches: nitride memristors. The switching material is an AlN film, deposited using atomic layer deposition (ALD), and the electrodes can be TiN, Pt or Al. A variety of materials characterizations were performed to determine the structure, composition and impurities of the AlN films.
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Research context

OpenAlex topics: Advanced Memory and Neural Computing · Ferroelectric and Negative Capacitance Devices · Semiconductor materials and devices

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

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