journal article·2025-06

Mechanistic analysis of critical stress and crack propagation in glass under pulsed microwave plasma jet

Hong Yu, Wenhao Liu, Zeming Jin, Jiaqi Lai, Mengya Lin, Yuting Yan, Yuanzhe Ma, Pan Guo, Li-Yun Fu, Tobias M. Müller

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OpenAlex topics: Thin-Film Transistor Technologies · Copper Interconnects and Reliability · Advanced Surface Polishing Techniques

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