Spectroscopic ellipsometry research on the composition-spread La2−xCexCuO4 (0.1 ≤ x ≤ 0.19) film
Source abstract
Abstract
In recent decades, the application of high-throughput experimentation has significantly shortened the research period for materials science. However, there remains a critical gap in non-destructive, high-throughput characterization techniques. Spectroscopic ellipsometry (SE) is well-suitable to address this issue, allowing for a focused light spot. In this work, we employ SE to investigate the dielectric properties of an electron-doped cuprate superconductor, La2−xCexCuO4, with continuously varying Ce compositions from 0.1 to 0.19. The Drude fitting parameters from the ordinary part of dielectric tensor εo demonstrate that the free carrier concentration does not linearly increase with Ce doping, while the scattering rate does. In addition, the normalized resistivity values calculated by the Drude parameters are similar to those of the transport results. This work extremely broadens the SE horizon in high-throughput new tracks.
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Research context
OpenAlex topics: Physics of Superconductivity and Magnetism · ZnO doping and properties · Gas Sensing Nanomaterials and Sensors
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
Affiliations
School of Science, Tianjin University of Commerce 1 , Tianjin 300134,
School of Information Science and Engineering, Shandong University 2 , Qingdao 266237,
Beijing National Laboratory for Condensed Matter Physics, Institute of Physics, Chinese Academy of Sciences 3 , Beijing 100190,
Songshan Lake Materials Laboratory 4 , Dongguan, Guangdong 523808,
Department of Materials Science and Engineering, Southern University of Science and Technology 5 , Shenzhen 518055,
School of Physical Sciences, University of Chinese Academy of Sciences 6 , Beijing 100049,
Funding
National Key Research and Development Program of China · National Natural Science Foundation of China · Young Team of Basic Research of Chinese Academy of Sciences
References (23)
Show source-provided references
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