journal article·2018-06-01Open access

Publisher’s Note: “Structural analysis of LaVO3 thin films under epitaxial strain” [APL Materials 6, 046102 (2018)]

H. Meley, Karandeep, L. Oberson, J. de Bruijckere, D. T. L. Alexander, J.-M. Triscone, Ph. Ghosez, S. Gariglio

APL Materials· Volume 6· Issue 6

Abstract

peer reviewed
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short

Research context

OpenAlex topics: Gas Sensing Nanomaterials and Sensors · Catalytic Processes in Materials Science

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Affiliations

DQMP, University of Geneva 1 , 24 Quai E.-Ansermet, CH-1211 Geneva, Switzerland

Physique Th ́eorique des Mat ́eriaux, Universit ́e de Li ̀ege (B5) 2 , B-4000 Li ̀ege, Belgium

Interdisciplinary Centre for Electron Microscopy (CIME), E ́cole Polytechnique Fe ́de ́rale de Lausanne (EPFL) 3 , CH-1015 Lausanne, Switzerland

References

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