Contrast analysis for rapid characterization of 2D WTe2 structures

Two-dimensional (2D) layered materials, particularly transition metal dichalcogenides, exhibit unique electronic and optical properties. Among these, tungsten ditelluride (WTe2) has garnered attention for its semi-metallic behavior and topologically nontrivial band structure, making it a promising candidate for advanced nanoelectronic applications. A significant challenge, however, lies in achieving scalable characterization, determining thickness and coverage of WTe2 structures. Existing methods are often limited by time constraints and lack suitability for high-throughput workflows. This study introduces a refined workflow combining optical imaging, segmentation, and contrast analysis to address these limitations. Calculated values of normalized optical contrast were correlated with thicknesses determined by atomic force microscopy and were found to scale linearly. The proposed workflow provides a scalable, adaptable solution for 2D material characterization.