Magnetocrystalline anisotropies in MnxPtSn thin films
Source abstract
Abstract
The magnetic anisotropy determines the equilibrium orientation of the magnetization in a ferromagnet. In Mn-based inverse tetragonal Heusler compounds, a large uniaxial anisotropy makes these materials excellent candidates for both spin-transfer-torque and skyrmionic devices. Here, we present systematic investigations of the magnetocrystalline anisotropies in MnxPtSn films (x = 1.0–1.6). We find that the MnxPtSn films, grown by magnetron sputtering on MgO substrates, show a structural transition between x = 1.0 and 1.2 from cubic to tetragonal, where the tetragonal structure shows a twinned in-plane c-axis orientation. From ferromagnetic resonance measurements, we determine the out-of-plane and in-plane uniaxial anisotropies, taking into account the particular structural properties of the films. We find a strong dependence of the uniaxial anisotropies on the Mn concentration, as well as on structural distortions due to the lattice-matched growth. From temperature-dependent ferromagnetic resonance measurements, we infer the evolution of the in-plane uniaxial anisotropy and observe the presence of additional magnetic interactions and magnetization relaxation mechanisms around the spin reorientation transition.
Source: crossref · Quality: baseline
Research context
OpenAlex topics: Heusler alloys: electronic and magnetic properties · Magnetic properties of thin films · Magnetic Properties and Applications
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
Affiliations
Max Planck Institute for Chemical Physics of Solids 1 , 01187 Dresden, Germany
Institut für Festkörper- und Materialphysik, Technische Universität Dresden 2 , 01062 Dresden, Germany
Center for Transport and Devices of Emergent Materials, Technische Universität Dresden 3 , 01062 Dresden, Germany
Department of Physics, University of Konstanz 4 , 78457 Konstanz, Germany
Funding
Deutsche Forschungsgemeinschaft · H2020 Future and Emerging Technologies
References (34)
Show source-provided references
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