journal article·2015-01-01Open access

Growth and optical characteristics of high-quality ZnO thin films on graphene layers

Suk In Park, Youngbin Tchoe, Hyeonjun Baek, Jaehyuk Heo, Jerome K. Hyun, Janghyun Jo, Miyoung Kim, Nam-Jung Kim, Gyu-Chul Yi

APL Materials· Volume 3· Issue 1

Abstract

We report the growth of high-quality, smooth, and flat ZnO thin films on graphene layers and their photoluminescence (PL) characteristics. For the growth of high-quality ZnO thin films on graphene layers, ZnO nanowalls were grown using metal-organic vapor-phase epitaxy on oxygen-plasma treated graphene layers as an intermediate layer. PL measurements were conducted at low temperatures to examine strong near-band-edge emission peaks. The full-width-at-half-maximum value of the dominant PL emission peak was as narrow as 4 meV at T = 11 K, comparable to that of the best-quality films reported previously. Furthermore, the stimulated emission of ZnO thin films on the graphene layers was observed at the low excitation energy of 180 kW/cm2 at room temperature. Their structural and optical characteristics were investigated using X-ray diffraction, transmission electron microscopy, and PL spectroscopy.
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Research context

OpenAlex topics: ZnO doping and properties · Ga2O3 and related materials · Gas Sensing Nanomaterials and Sensors

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

Affiliations

Seoul National University 1 Department of Physics and Astronomy, and Institute of Applied Physics, , Seoul 151-747, South Korea

Samsung Electronics Co., Ltd. 2 Advanced Development Team, LED Business, , San#24 Nongseo-Dong, Giheung-Gu, Yongin-City, Gyeonggi-Do 446–711, South Korea

Seoul National University 3 Department of Materials Science and Engineering, , Seoul 151–744, South Korea

Korea Military Academy 4 Department of Physics and Chemistry, , Seoul, South Korea

Funding

National Research Foundation of Korea

References (25)

Show source-provided references
1. Science · 2010 · 330 · 65510.1126/science.1195403 ↗
2. Appl. Phys. Lett. · 2009 · 95 · 21310110.1063/1.3266836 ↗
3. J. Phys. Chem. C · 2009 · 113 · 1913410.1021/jp9078713 ↗
4. Science · 2006 · 312 · 24210.1126/science.1124005 ↗
5. Nanoscale · 2011 · 3 · 25810.1039/c0nr00588f ↗
6. Small · 2010 · 6 · 30710.1002/smll.200901968 ↗
7. Nanoscale · 2011 · 3 · 352210.1039/c1nr10370a ↗
8. ACS Appl. Mater. Interfaces · 2014 · 6 · 37710.1021/am404411c ↗
9. ACS Nano · 2011 · 5 · 419710.1021/nn200942s ↗
10. Adv. Mater. · 2010 · 22 · 51510.1002/adma.200902736 ↗
11. Appl. Phys. Lett. · 2011 · 98 · 09311210.1063/1.3558732 ↗
12. ACS Nano · 2009 · 3 · 90710.1021/nn900150y ↗
13. Phys. Status Solidi B · 2002 · 229 · 90310.1002/1521-3951(200201)229:2<903::AID-PSSB903>3.0.CO;2-N ↗
14. Adv. Mater. · 2012 · 24 · 51510.1002/adma.201103829 ↗
15. J. Appl. Phys. · 1999 · 86 · 40810.1063/1.370744 ↗
16. J. Cryst. Growth · 2000 · 209 · 53710.1016/s0022-0248(99)00615-6 ↗
17. J. Appl. Phys. · 1998 · 84 · 259710.1063/1.368440 ↗
18. Appl. Phys. Lett. · 1996 · 68 · 40310.1063/1.116699 ↗
19. Phys. Status Solidi B · 2001 · 226 · R410.1002/1521-3951(200107)226:1<R4::AID-PSSB99994>3.0.CO;2-F ↗
20. Jpn. J. Appl. Phys., Part 1 · 2003 · 42 · 224110.1143/JJAP.42.2241 ↗
21. Phys. Status Solidi B · 2002 · 229 · 84110.1002/1521-3951(200201)229:2<841::aid-pssb841>3.3.co;2-a ↗
22. Appl. Phys. Lett. · 2007 · 91 · 07210110.1063/1.2768917 ↗
23. Phys. Rev. B · 1998 · 57 · 1215110.1103/PhysRevB.57.12151 ↗
24. Phys. Rev. B · 2004 · 70 · 19520710.1103/PhysRevB.70.195207 ↗
25. Solid State Commun. · 1997 · 103 · 45910.1016/s0038-1098(97)00216-0 ↗