Evidence for multifilamentary valence changes in resistive switching SrTiO3 devices detected by transmission X-ray microscopy
Source abstract
Abstract
Transmission X-ray microscopy is employed to detect nanoscale valence changes in resistive switching SrTiO3 thin film devices. By recording Ti L-edge spectra of samples in different resistive states, we could show that some spots with slightly distorted structure and a small reduction to Ti3+ are already present in the virgin films. In the ON-state, these spots are further reduced to Ti3+ to different degrees while the remaining film persists in the Ti4+ configuration. These observations are consistent with a self-accelerating reduction within pre-reduced extended growth defects.
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Research context
OpenAlex topics: Advanced Memory and Neural Computing · Electronic and Structural Properties of Oxides · Ferroelectric and Negative Capacitance Devices
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
Affiliations
Research Center Jülich 1 Peter Grünberg Insitute 7, , 52428 Jülich, Germany
Institute for Soft Matter and Functional Materials 2 Helmholtz-Zentrum für Materialien und Energie GmbH, , Albert-Einstein-Str. 15, 12489 Berlin, Germany
Research Center Juelich 3 Ernst Ruska-Centre (ER-C) for Microscopy and Spectroscopy with Electrons, , 52425 Juelich, Germany
RWTH Aachen University 4 IWE 2 & JARA-FIT, , 52056 Aachen, Germany
References (37)
Show source-provided references
1. Adv. Mater. · 2009 · 21 · 263210.1002/adma.200900375 ↗
2. Nature Mater. · 2007 · 6 · 83310.1038/nmat2023 ↗
3. Nature (London) · 2008 · 453 · 8010.1038/nature06932 ↗
4. Appl. Phys. Lett. · 2012 · 100 · 23350910.1063/1.4728118 ↗
5. Adv. Mater. · 2010 · 22 · 357310.1002/adma.201000186 ↗
6. J. Appl. Phys. · 2012 · 111 · 07610110.1063/1.3699315 ↗
7. Nature Mater. · 2006 · 5 · 31210.1038/nmat1614 ↗
8. Nanotechnology · 2009 · 20 · 48570110.1088/0957-4484/20/48/485701 ↗
9. Proc. IEEE · 2012 · 100 · 197910.1109/JPROC.2012.2188771 ↗
10. Adv. Mater. · 2010 · 22 · 481910.1002/adma.201001872 ↗
11. Nat. Photonics · 2012 · 6 · 2510.1038/NPHOTON.2011.268 ↗
12. Appl. Phys. Lett. · 2011 · 98 · 24211410.1063/1.3599589 ↗
13. Phys. Rev. B · 2013 · 87 · 19540910.1103/PhysRevB.87.195409 ↗
14. Phys. Rev. Lett. · 2010 · 105 · 22610210.1103/PhysRevLett.105.226102 ↗
15. See supplementary material at http://dx.doi.org/10.1063/1.4822438 for details on PLD growth parameters and sample preparation.
16. 1997
17. Adv. Mater. · 2009 · 21 · 237710.1002/adma.200803360 ↗
18. Thin Solid Films · 2013 · 533 · 4310.1016/j.tsf.2012.11.118 ↗
19. Appl. Phys. Lett. · 1993 · 62 · 243410.1063/1.109388 ↗
20. Appl. Phys. Lett. · 2013 · 102 · 18350410.1063/1.4804364 ↗
21. Phys. Chem. Chem. Phys. · 2013 · 15 · 831110.1039/c3cp50272d ↗
22. Phys. Rev. B · 1991 · 44 · 541910.1103/PhysRevB.44.5419 ↗
23. Phys. Rev. B · 1990 · 41 · 92810.1103/PhysRevB.41.928 ↗
24. Phys. Rev. B · 2010 · 81 · 12512110.1103/PhysRevB.81.125121 ↗
25. Phys. Rev. B · 1990 · 42 · 545910.1103/PhysRevB.42.5459 ↗
26. Nature (London) · 2002 · 419 · 37810.1038/nature00977 ↗
27. Nature (London) · 2004 · 430 · 65710.1038/nature02756 ↗
28. Nature Mater. · 2013 · 12 · 70310.1038/nmat3674 ↗
29. J. Appl. Phys. · 2013 · 113 · 22430110.1063/1.4809978 ↗
30. Eur. Phys. J. B · 2009 · 72 · 5310.1140/epjb/e2009-00339-4 ↗
31. J. Phys. Condens. Matter · 1992 · 4 · 418910.1088/0953-8984/4/16/019 ↗
32. Phys. Chem. Miner. · 1992 · 19 · 14010.1007/BF00202101 ↗
33. MRS Proceedings · 2009 · 1160 · 116010.1557/PROC-1160-H09-03 ↗
34. Nanotechnology · 2011 · 22 · 25400110.1088/0957-4484/22/25/254001 ↗
35. Nat. Nanotechnol. · 2010 · 5 · 14810.1038/nnano.2009.456 ↗
36. Phys. Rev. B · 2004 · 69 · 24510210.1103/PhysRevB.69.245102 ↗
37. Am. Mineral. · 2007 · 92 · 57710.2138/am.2007.2344 ↗