journal article·2013-07-01Open access

High quality transparent TiO2/Ag/TiO2 composite electrode films deposited on flexible substrate at room temperature by sputtering

Aritra Dhar, T. L. Alford

APL Materials· Volume 1· Issue 1

Abstract

Multilayer structures of TiO2/Ag/TiO2 have been deposited onto flexible substrates by room temperature sputtering to develop indium-free transparent composite electrodes. The effect of Ag thicknesses on optical and electrical properties and the mechanism of conduction have been discussed. The critical thickness (tc) of Ag mid-layer to form a continuous conducting layer is 9.5 nm and the multilayer has been optimized to obtain a sheet resistance of 5.7 Ω/sq and an average optical transmittance of 90% at 590 nm. The Haacke figure of merit (FOM) for tc has one of the highest FOMs with 61.4 × 10−3 Ω−1/sq.
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Research context

OpenAlex topics: ZnO doping and properties · Copper-based nanomaterials and applications · Gas Sensing Nanomaterials and Sensors

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

Affiliations

Arizona State University 1 Department of Chemistry and Biochemistry, , Tempe, Arizona 85287, USA

Arizona State University 2 School for Engineering of Matter, Transport, and Energy, , Tempe, Arizona 85287, USA

References (27)

Show source-provided references
1. Appl. Phys. Lett. · 2007 · 90 · 22210710.1063/1.2743746 ↗
2. Nature (London) · 1992 · 357 · 47710.1038/357477a0 ↗
3. Appl. Phys. Lett. · 2010 · 96 · 06210210.1063/1.3310043 ↗
4. Appl. Phys. Lett. · 2007 · 91 · 11211310.1063/1.2785152 ↗
5. Appl. Phys. Lett. · 2006 · 88 · 03210610.1063/1.2165281 ↗
6. Thin Solid Films · 1983 · 102 · 110.1016/0040-6090(83)90256-0 ↗
7. J. Appl. Phys. · 2008 · 103 · 01370810.1063/1.2829788 ↗
8. J. Appl. Phys. · 2012 · 112 · 10311310.1063/1.4767662 ↗
9. J. Appl. Phys. · 2009 · 105 · 12352810.1063/1.3153977 ↗
10. Appl. Phys. Lett. · 2010 · 96 · 05112410.1063/1.3298644 ↗
11. Thin Solid Films · 2011 · 520 · 110.1016/j.tsf.2011.06.091 ↗
12. Appl. Phys. Lett. · 2010 · 96 · 04110910.1063/1.3299259 ↗
13. J. Appl. Phys. · 2009 · 106 · 06351010.1063/1.3213385 ↗
14. Thin Solid Films · 1991 · 200 · 1110.1016/0040-6090(91)90026-T ↗
15. Thin Solid Films · 2005 · 475 · 18310.1016/j.tsf.2004.08.033 ↗
16. , Jpn. J. Appl. Phys. · 2005 · 44 · 826910.1143/JJAP.44.8269 ↗
17. J. Appl. Phys. · 2003 · 93 · 92410.1063/1.1530714 ↗
18. J. Phys.: Condens. Matter · 1994 · 6 · 951910.1088/0953-8984/6/45/005 ↗
19. Phys. Rev. · 1956 · 104 · 150810.1103/PhysRev.104.1508 ↗
20. Appl. Phys. Lett. · 2009 · 94 · 05210410.1063/1.3077184 ↗
21. J. Appl. Phys. · 2011 · 109 · 10431810.1063/1.3592975 ↗
22. Appl. Phys. Lett. · 2010 · 96 · 20110910.1063/1.3435467 ↗
23. Phys. Rev. B · 1970 · 1 · 138210.1103/PhysRevB.1.1382 ↗
24. Appl. Phys. Lett. · 2010 · 96 · 23311410.1063/1.3442916 ↗
25. J. Appl. Phys. · 2009 · 106 · 10310410.1063/1.3259426 ↗
26. Thin Solid Films · 1998 · 326 · 20510.1016/S0040-6090(98)00554-9 ↗
27. J. Appl. Phys. · 1976 · 47 · 408610.1063/1.323240 ↗