Low-Energy Electron Microscopy of Surface Phase Transitions
Source abstract
Abstract
▪ Abstract The use of low-energy electron microscopy (LEEM) to study reversible surface phase transitions is reviewed. Representative experiments are described that highlight the key advantages of LEEM: the ability to image surfaces in situ, at elevated temperature, with good spatial and temporal resolution. With these capabilities, the evolution of individual surface features—domains, facets, islands, steps, etc.—can be measured. Real-time and real-space imaging make LEEM a powerful tool for characterizing the thermodynamics and kinetics that govern surface phase transformations.
Source: crossref · Quality: baseline
Research context
OpenAlex topics: nanoparticles nucleation surface interactions · Surface and Thin Film Phenomena · Advanced Electron Microscopy Techniques and Applications
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
Affiliations
IBM Research Division, T.J. Watson Research Center, Yorktown Heights, New York 10598;
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