Characterization of ceramics and glass using proton-induced X-ray emission

Proton-induced X-ray emission (PIXE) is one of various chemical analysis tools that uses X-rays to identify individual elements. It is closely related to X-ray fluorescence (XRF) and electron microprobe analysis (EMA). Although XRF and EMA are routinely used by materials engineers, PIXE is relatively uncommon. On the other hand, PIXE has proved to be the preferred technique in several specialized applications in environmental and biological studies. Many of the authors of this paper have recently demonstrated the utility of the technique in analyzing various commercial glass plates with and without transition-metal oxide coatings. The recent development of focused proton beams increases the potential of PIXE for the analysis of engineering materials.