journal article·2008-09

Dielectric Constants of Modified C60Extracted from Reflection‐Electron‐Energy‐Loss Spectroscopy Data

V. V. Shnitov

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Abstract

Abstract A new calculation technique providing correct conversion of experimental data obtained by reflection‐electron‐energy loss spectroscopy (REELS) into respective dielectric functions has been developed. The technique was successfully applied to processing a series of REELS spectra taken from C60 film in the course of its irradiation with the flux of 1.5 keV electrons. As a result, a number of complex dielectric functions ε = ε1+iε2 corresponding to the different stages of fullerite C60 electron induced modification was obtained for the first time. These data provide an exhaustive characterization of electronic and optical properties of arbitrary modified C60, thereby give a serious impetus to the search for the new technological applications of this material. Keywords: Fullerite C60 Induced modificationREELSDielectric constants ACKNOWLEDGMENTS The research was supported by and by the Russian Academy of Sciences (program “Influence of Atomic Structure on the Properties of Condensed Matter,” project 2.14) and by The Russian Federal Agency for Science and Innovation (grant NSh 9085.2006.2). The author also would like to thank Professor V.A. Kosobukin for fruitful discussion which helped to substantially improve the logical structure of presented material.
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OpenAlex topics: Fullerene Chemistry and Applications · Electron and X-Ray Spectroscopy Techniques · Graphene research and applications

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