Peakforce Infrared Micoscopy: Revealing Phonon Polaritons in Hexagonal Boron Nitride by Multipulse Peak Force Infrared Microscopy (Advanced Optical Materials 5/2020)
Source abstract
Abstract
The combination of atomic force microscopy and infrared radiation provides a route for nanoscale mapping of phonon polaritons in 2D materials. In article number 1901084, Xiaoji G. Xu and co-workers demonstrate a photothermal-based technique – peakforce infrared (PFIR) microscopy – that can detect phonon polaritons in h-BN, as an affordable and simple alternative to scattering scanning near-field optical microscopy. Multi-pulse PFIR further enhances the signal intensity and improves imaging capability.
Source: openalex_inverted_index · Quality: baseline
Research context
OpenAlex topics: Spectroscopy Techniques in Biomedical and Chemical Research · Photoacoustic and Ultrasonic Imaging · Thermography and Photoacoustic Techniques
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
Affiliations
Department of Chemistry Lehigh University 6 E Packer Ave. Bethlehem PA 18015 USA
Bruker Nano Surfaces 112 Robin Hill Road Santa Barbara CA 93117 USA
Department of Physics University of California Santa Cruz CA 95064 USA
Tim Taylor Department of Chemical Engineering Kansas State University Manhattan KS 66506 USA
References
Reference metadata was not supplied for this record.