Plasma Carriers on Graphene: Relaxation of Plasma Carriers in Graphene: An Approach by Frequency‐Dependent Optical Conductivity Measurement (Advanced Optical Materials 14/2018)
Source abstract
Abstract
Charge carriers injected onto a graphene layer are perturbed by the probing microwave as rippling waves. By tracing these waves the mass and mobility of electrons can be determined experimentally in the technique referred as Field-Induced Time-Resolved Microwave Conductivity (FI-TEMC) measurement, as shown by Shu Seki and co-workers in article number 1701402.
Source: openalex_inverted_index · Quality: baseline
Research context
OpenAlex topics: Photonic and Optical Devices · Analytical Chemistry and Sensors
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Affiliations
Department of Molecular Engineering Graduate School of Engineering Kyoto University Nishikyo‐ku Kyoto 615‐8510 Japan
NTT Basic Research Laboratories Morinosato Wakamiya 3‐1 Atsugi Kanagawa 243‐0198 Japan
School of Science and Engineering Meisei University 2‐1‐1 Hodokubo, Hino Tokyo 191‐8506 Japan
References
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