Reconfigurable Flat Optics with Programmable Reflection Amplitude Using Lithography‐Free Phase‐Change Material Ultra‐Thin Films (Advanced Optical Materials 2/2021)
Source abstract
Abstract
This cover page illustrates a near-infrared light beam being reflected off a multilayer stack comprising a thin layer of GeSbTe (GST), a dielectric spacer, and a gold layer. By engineering the thicknesses, a very large dynamic optical modulation from strong reflection (R = 80%) to perfect absorption (A > 99.995%) is experimentally demonstrated via changing the phase of GST. This lithography-free platform features multilevel and non-volatile reconfigurable optical properties: more than 100 intermediate levels of reflection, corresponding to different partial crystallization of GST, were demonstrated. For further details see article number 2001291 by Lotfi Berguiga and co-workers.
Source: openalex_inverted_index · Quality: baseline
Research context
OpenAlex topics: Phase-change materials and chalcogenides · Advanced optical system design · Liquid Crystal Research Advancements
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
Affiliations
Université de Lyon Institut des Nanotechnologies de Lyon–INL CNRS UMR 5270 Ecole Centrale de Lyon Ecully 69134 France
STMicroelectronics 850 Rue Jean Monnet Crolles 38920 France
Aix Marseille Univ CNRS Centrale Marseille Institut Fresnel Marseille F‐13013 France
Université Côte d'Azur CNRS UPR 10 CRHEA rue B. Gregory Valbonne 06560 France
Université de Lyon Institut des Nanotechnologies de Lyon‐INL CNRS UMR 5270 INSA Lyon Villeurbanne 69621 France
References
Reference metadata was not supplied for this record.