journal article·2025-11Open access

High‐T c Superinductors Through Tailored Metamaterial Losses

Teng Chen Ietro Pang, Muhammad Helmi Bin Azmi, Yogesh Kumar Srivastava, Ranjan Singh

Advanced Optical Materials· Volume 13· Issue 32

Abstract

Abstract Superinductance, with impedance surpassing the quantum resistance of 6.47 kΩ, has recently been discovered in high‐temperature superconducting terahertz metamaterials, enabling advancement in quantum computing and high‐frequency electronics. Superconducting Cooper pairs enable low‐loss kinetic inductance, a crucial factor in achieving superinductance. However, sustaining this effect at terahertz frequencies is hindered by increasing ohmic losses, necessitating a deeper understanding of dissipation mechanisms. In this study, radiative and ohmic losses are systematically analyzed in metamaterial LC resonators fabricated with 25 and 50 nm YBa 2 Cu 3 O 7‐δ films. Using a Lorentzian fitting function derived from coupled‐mode theory, a parametric loss model linking radiative losses is established to film conductivity, providing design principles for optimized superconducting metamaterials with sustained superinductance. This work lays the foundation for scalable metamaterial superinductor design, advancing quantum computing, kinetic inductance detectors, and terahertz high‐temperature superconductor based single photon detectors.
Source: crossref · Quality: baseline

Research context

OpenAlex topics: Quantum and electron transport phenomena · Magnetic properties of thin films · Semiconductor materials and devices

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

Affiliations

Division of Physics and Applied Physics School of Physical and Mathematical Sciences Nanyang Technological University Singapore 637371 Singapore

Centre for Disruptive Photonic Technologies Nanyang Technological University Singapore 639798 Singapore

Department of Physics Indian Institute of Technology Hyderabad Kandi Telangana 502285 India

Department of Electrical Engineering University of Notre Dame Notre Dame IN 46556 USA

Funding

National Research Foundation Singapore

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