3D Measurements and Characterizations of Refractive Index Distributions of Volume Holographic Gratings Using Low‐Coherence Holotomography
Source abstract
Abstract
Abstract Holographic Optical Elements (HOEs) employ refractive index (RI) modulation to manipulate light, establishing their widespread application in augmented and virtual reality technologies. Despite significant strides in HOEs' fabrication, a comprehensive 3D examination and measurement of these elements remain largely unexplored. This study targets this void by conducting an in‐depth exploration of the 3D RI distributions of volume holographic gratings (VHGs), a quintessential representative of HOEs. Direct tomographic measurements of the 3D RI distributions within millimeter‐scale VHGs are performed at a spatial resolution of 156 nm × 156 nm × 1.2 µm and an RI precision of 2×10−4. This level of precision facilitates a systematic high‐resolution characterization of VHGs. The findings present a substantial evolution from traditional measurement techniques and promise to considerably advance the evaluation of intricate HOE structures and refine the corresponding fabrication processes.
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Research context
OpenAlex topics: Optical Coherence Tomography Applications · Digital Holography and Microscopy · Advanced Optical Imaging Technologies
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
Affiliations
KAIST Institute for Health Science and Technology KAIST Daejeon 34141 Republic of Korea
Department of Physics KAIST Daejeon 34141 Republic of Korea
KU‐KIST Graduate School of Converging Science and Technology Korea University Seoul 02841 Republic of Korea
Tomocube Inc. Daejeon 34109 Republic of Korea
Department of Biomicrosystem Technology Korea University Seoul 02841 Republic of Korea
Department of Integrative Energy Engineering and KU Photonics Center Korea University Seoul 02841 Republic of Korea
Center for Opto‐Electronic Materials and Devices Post‐Silicon Semiconductor Institute Korea Institute of Science and Technology (KIST) Seoul 02792 Republic of Korea
Funding
National Research Foundation of Korea · Korea Institute of Science and Technology
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