Polarized Band‐Edge Emission and Dichroic Optical Behavior in Thin Multilayer GeS
Source abstract
Abstract
Dichroic band-edge emission of a GeS multilayer is characterized by using polarized photoluminescence measurements with polarization angles ranging from E||b (θ = 0°) to E⊥b (E||a, θ = 90°). The band-edge emission at ca. 1.622 eV clearly shows sinusoidal variation of light intensity with respect to the multilayer stripe's b axis. The in-plane optical anisotropy of the stripelike GeS is clearly shown. As a service to our authors and readers, this journal provides supporting information supplied by the authors. Such materials are peer reviewed and may be re-organized for online delivery, but are not copy-edited or typeset. Technical support issues arising from supporting information (other than missing files) should be addressed to the authors. Please note: The publisher is not responsible for the content or functionality of any supporting information supplied by the authors. Any queries (other than missing content) should be directed to the corresponding author for the article.
Source: openalex_inverted_index · Quality: baseline
Research context
OpenAlex topics: 2D Materials and Applications · Phase-change materials and chalcogenides · Photonic and Optical Devices
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
Affiliations
Graduate Institute of Applied Science and Technology National Taiwan University of Science and Technology Taipei 106 Taiwan
Graduate Institute of Electro‐Optical Engineering and Department of Electronic and Computer Engineering National Taiwan University of Science and Technology Taipei 106 Taiwan
Funding
Ministry of Science and Technology, Taiwan
References (26)
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